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Takashi Baba

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Patents Grantslast 30 patents

  • Information Patent Grant

    Mass spectrometer
    • Patent number 8,080,786
    • Issue date Dec 20, 2011
    • Hitachi High-Technologies Corporation
    • Takashi Baba
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Grant

    Mass spectroscopy system and mass spectroscopy method
    • Patent number 7,906,759
    • Issue date Mar 15, 2011
    • Hitachi High-Technologies Corporation
    • Naomi Manri
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Grant

    Methods and instruments for identification of glycosylated proteins...
    • Patent number 7,829,845
    • Issue date Nov 9, 2010
    • Hitachi High-Technologies Corporation
    • Kisaburo Deguchi
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Method of mass spectrometry and mass spectrometer
    • Patent number 7,675,033
    • Issue date Mar 9, 2010
    • Hitachi, Ltd.
    • Yuichiro Hashimoto
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Grant

    Mass spectrometer
    • Patent number 7,608,819
    • Issue date Oct 27, 2009
    • Hitachi High-Technologies Corporation
    • Takashi Baba
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Grant

    Method of mass spectrometry and mass spectrometer
    • Patent number 7,592,589
    • Issue date Sep 22, 2009
    • Hitachi, Ltd.
    • Yuichiro Hashimoto
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Grant

    Reaction cell and mass spectrometer
    • Patent number 7,589,321
    • Issue date Sep 15, 2009
    • Hitachi High-Technologies Corporation
    • Yuichiro Hashimoto
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Grant

    Mass spectrometer
    • Patent number 7,589,320
    • Issue date Sep 15, 2009
    • Hitachi High-Technologies Corporation
    • Takashi Baba
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Grant

    Mass spectrometer
    • Patent number 7,569,814
    • Issue date Aug 4, 2009
    • Hitachi High-Technologies Corporation
    • Yuichiro Hashimoto
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Grant

    Mass spectrometer
    • Patent number 7,397,025
    • Issue date Jul 8, 2008
    • Hitachi High-Technologies Corporation
    • Takashi Baba
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Grant

    Mass spectrometer
    • Patent number 7,381,946
    • Issue date Jun 3, 2008
    • Hitachi High-Technologies Corporation
    • Takashi Baba
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Grant

    Mass spectrometer
    • Patent number 7,348,554
    • Issue date Mar 25, 2008
    • Hitachi High-Technologies Corporation
    • Yuichiro Hashimoto
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Grant

    Mass spectrometer
    • Patent number 7,329,862
    • Issue date Feb 12, 2008
    • Hitachi High-Technologies, Corporation
    • Yuichiro Hashimoto
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Grant

    Mass spectrometer
    • Patent number 7,309,860
    • Issue date Dec 18, 2007
    • Hitachi High-Technologies Corporation
    • Takashi Baba
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Grant

    Methods and apparatus for electron or positron capture dissociation
    • Patent number 7,227,133
    • Issue date Jun 5, 2007
    • The University of North Carolina at Chapel Hill
    • Gary L. Glish
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Grant

    Mass spectrometer
    • Patent number 7,208,728
    • Issue date Apr 24, 2007
    • Hitachi High-Technologies Corporation
    • Yuichiro Hashimoto
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Grant

    Mass spectrometer
    • Patent number 7,166,835
    • Issue date Jan 23, 2007
    • Hitachi High-Technologies Corporation
    • Takashi Baba
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Grant

    Mass spectrometer
    • Patent number 7,129,478
    • Issue date Oct 31, 2006
    • Hitachi High-Technologies Corporation
    • Takashi Baba
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Grant

    Mass spectrometer
    • Patent number 6,967,323
    • Issue date Nov 22, 2005
    • Hitachi High-Technologies Corporation
    • Yuichiro Hashimoto
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Grant

    Mass spectrometer and mass spectrometric method
    • Patent number 6,888,134
    • Issue date May 3, 2005
    • Hitachi High-Technologies Corporation
    • Yuichiro Hashimoto
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Grant

    Mass spectrometer
    • Patent number 6,852,972
    • Issue date Feb 8, 2005
    • Hitachi High-Technologies Corporation
    • Takashi Baba
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Grant

    Electric charge adjusting method, device therefor, and mass spectro...
    • Patent number 6,852,971
    • Issue date Feb 8, 2005
    • Hitachi, Ltd.
    • Takashi Baba
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Grant

    Mass spectrometer
    • Patent number 6,797,949
    • Issue date Sep 28, 2004
    • Hitachi High-Technologies Corporation
    • Yuichiro Hashimoto
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Grant

    Ion trap mass spectrometry and apparatus
    • Patent number 6,566,651
    • Issue date May 20, 2003
    • Hitachi, Ltd.
    • Takashi Baba
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Ion trap mass spectrometry and apparatus
    • Patent number 6,489,609
    • Issue date Dec 3, 2002
    • Hitachi, Ltd.
    • Takashi Baba
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Mass spectrometer
    • Patent number 6,075,244
    • Issue date Jun 13, 2000
    • Hitachi, Ltd.
    • Takashi Baba
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Grant

    Ion trapping mass spectrometry apparatus
    • Patent number 5,783,824
    • Issue date Jul 21, 1998
    • Hitachi, Ltd.
    • Takashi Baba
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Grant

    Ion trapping mass spectrometry method and apparatus therefor
    • Patent number 5,679,950
    • Issue date Oct 21, 1997
    • Hitachi, Ltd.
    • Takashi Baba
    • G01 - MEASURING TESTING

Patents Applicationslast 30 patents

  • Information Patent Application

    Method Of Mass Spectrometry And Mass Spectrometer
    • Publication number 20100219337
    • Publication date Sep 2, 2010
    • Yuichiro Hashimoto
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Application

    Mass Spectrometer
    • Publication number 20090294646
    • Publication date Dec 3, 2009
    • Hitachi High-Technologies Corporation
    • Takashi Baba
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Application

    Method of mass spectrometry and mass spectrometer
    • Publication number 20090189065
    • Publication date Jul 30, 2009
    • Yuichiro Hashimoto
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Application

    MASS SPECTROSCOPY SYSTEM AND MASS SPECTROSCOPY METHOD
    • Publication number 20090072132
    • Publication date Mar 19, 2009
    • Naomi Manri
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Application

    Mass spectrometer
    • Publication number 20080185516
    • Publication date Aug 7, 2008
    • Hitachi High-Technologies Corporation
    • Takashi Baba
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Application

    Mass spectrometer
    • Publication number 20080156979
    • Publication date Jul 3, 2008
    • Hitachi High-Technologies Corporation
    • Yuichiro Hashimoto
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Application

    Mass spectrometer
    • Publication number 20080078930
    • Publication date Apr 3, 2008
    • Hitachi High-Technologies Corporation
    • Takashi Baba
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Application

    REACTION CELL AND MASS SPECTROMETER
    • Publication number 20080073508
    • Publication date Mar 27, 2008
    • Yuichiro Hashimoto
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Application

    Methods and instruments for identification of glycosylated proteins...
    • Publication number 20080048110
    • Publication date Feb 28, 2008
    • Hitachi High-Technologies, Corporation
    • Kisaburo DEGUCHI
    • G01 - MEASURING TESTING
  • Information Patent Application

    Method of mass spectrometry and mass spectrometer
    • Publication number 20070181804
    • Publication date Aug 9, 2007
    • Yuichiro Hashimoto
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Application

    Mass spectrometer
    • Publication number 20070069124
    • Publication date Mar 29, 2007
    • Hitachi High-Technologies Corporation
    • Takashi Baba
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Application

    Mass spectrometer
    • Publication number 20070023648
    • Publication date Feb 1, 2007
    • Hitachi High-Technologies Corporation
    • Takashi Baba
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Application

    Mass spectrometer
    • Publication number 20060284072
    • Publication date Dec 21, 2006
    • Hitachi High-Technologies Corporation
    • Yuichiro Hashimoto
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Application

    Mass spectrometer
    • Publication number 20060169892
    • Publication date Aug 3, 2006
    • Hitachi High-Technologies Corporation
    • Takashi Baba
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Application

    Mass spectrometer
    • Publication number 20050269504
    • Publication date Dec 8, 2005
    • Hitachi High-Technologies Corporation
    • Yuichiro Hashimoto
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Application

    Mass spectrometer
    • Publication number 20050258354
    • Publication date Nov 24, 2005
    • Hitachi High-Technologies Corporation
    • Takashi Baba
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Application

    Mass spectrometer
    • Publication number 20050178955
    • Publication date Aug 18, 2005
    • Hitachi High-Technologies Corporation
    • Takashi Baba
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Application

    Mass Spectrometer
    • Publication number 20050127290
    • Publication date Jun 16, 2005
    • Hitachi High-Technologies Corporation
    • Yuichiro Hashimoto
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Application

    Mass spectrometer
    • Publication number 20050023452
    • Publication date Feb 3, 2005
    • Hitachi High-Technologies Corporation
    • Yuichiro Hashimoto
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Application

    Methods and apparatus for electron or positron capture dissociation
    • Publication number 20040245448
    • Publication date Dec 9, 2004
    • Gary L. Glish
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Application

    Mass spectrometer and mass spectrometric method
    • Publication number 20040119015
    • Publication date Jun 24, 2004
    • Yuichiro Hashimoto
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Application

    Mass spectrometer
    • Publication number 20030222214
    • Publication date Dec 4, 2003
    • Takashi Baba
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Application

    Electric charge adjusting method, device therefor, and mass spectro...
    • Publication number 20030160169
    • Publication date Aug 28, 2003
    • Takashi Baba
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Application

    Mass spectrometer
    • Publication number 20030155507
    • Publication date Aug 21, 2003
    • Yuichiro Hashimoto
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Application

    Ion trap mass spectrometry and apparatus
    • Publication number 20030052264
    • Publication date Mar 20, 2003
    • Takashi Baba
    • G01 - MEASURING TESTING