Takashi DOBASHI

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Patents Grantslast 30 patents

Information Patent Grant
Charged particle beam apparatus and method for controlling charged...
- Patent number 11,791,131
- Issue date Oct 17, 2023
- HITACHI HIGH-TECH CORPORATION
- Takashi Dobashi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Charged particle beam apparatus and method of controlling charged p...
- Patent number 11,756,764
- Issue date Sep 12, 2023
- HITACHI HIGH-TECH CORPORATION
- Takashi Dobashi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Charged particle beam device and control method thereof
- Patent number 11,742,172
- Issue date Aug 29, 2023
- HITACHI HIGH-TECH CORPORATION
- Takashi Dobashi
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Measurement system and method for setting observation conditions of...
- Patent number 11,380,518
- Issue date Jul 5, 2022
- Hitachi, Ltd.
- Takafumi Miwa
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Charged particle beam application apparatus
- Patent number 11,177,108
- Issue date Nov 16, 2021
- HITACHI HIGH-TECH CORPORATION
- Yasuhiro Shirasaki
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Charged particle beam device for moving an aperture having pluralit...
- Patent number 10,636,621
- Issue date Apr 28, 2020
- Hitachi High-Technologies Corporation
- Akinari Hanawa
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
CHARGED PARTICLE BEAM APPARATUS AND METHOD FOR CONTROLLING CHARGED...
- Publication number 20220230844
- Publication date Jul 21, 2022
- HITACHI HIGH-TECH CORPORATION
- Takashi DOBASHI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CHARGED PARTICLE BEAM APPARATUS AND METHOD OF CONTROLLING CHARGED P...
- Publication number 20220216034
- Publication date Jul 7, 2022
- HITACHI HIGH-TECH CORPORATION
- Takashi DOBASHI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CHARGED PARTICLE BEAM DEVICE AND CONTROL METHOD THEREOF
- Publication number 20220059313
- Publication date Feb 24, 2022
- Hitachi High-Tech Corporation
- Takashi Dobashi
- G01 - MEASURING TESTING
Information Patent Application
Measurement System and Method for Setting Observation Conditions of...
- Publication number 20210407763
- Publication date Dec 30, 2021
- Hitachi, Ltd
- Takafumi MIWA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CHARGED PARTICLE BEAM APPLICATION APPARATUS
- Publication number 20210005417
- Publication date Jan 7, 2021
- Hitachi High-Tech Corporation
- Yasuhiro Shirasaki
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Charged Particle Beam Device and Sample Observation Method
- Publication number 20180076004
- Publication date Mar 15, 2018
- Hitachi High-Technologies Corporation
- Akinari HANAWA
- H01 - BASIC ELECTRIC ELEMENTS