Takashi Gemma

Person

Shibuya, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Method and device for measuring wavefront using diffraction grating...
- Patent number 10,571,340
- Issue date Feb 25, 2020
- Nikon Corporation
- Katsura Otaki
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Method and device for measuring wavefront using light-exit section...
- Patent number 10,288,489
- Issue date May 14, 2019
- Nikon Corporation
- Katsura Otaki
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Projection optical system inspecting method and inspection apparatu...
- Patent number 7,868,997
- Issue date Jan 11, 2011
- Nikon Corporation
- Mikihiko Ishii
- G01 - MEASURING TESTING
Information Patent Grant
Projection optical system inspecting method and inspection apparatu...
- Patent number 7,843,550
- Issue date Nov 30, 2010
- Nikon Corporation
- Mikihiko Ishii
- G01 - MEASURING TESTING
Information Patent Grant
Interferometer that measures aspherical surfaces
- Patent number 6,456,382
- Issue date Sep 24, 2002
- Nikon Corporation
- Hiroshi Ichihara
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Interferometric apparatus and methods for measuring surface topogra...
- Patent number 6,344,898
- Issue date Feb 5, 2002
- Nikon Corporation
- Takashi Gemma
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus and methods for detecting and correcting distortion of in...
- Patent number 6,008,904
- Issue date Dec 28, 1999
- Nikon Corporation
- Mikihiko Ishii
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Apparatus and methods for measuring wavefront aberrations of a micr...
- Patent number 5,898,501
- Issue date Apr 27, 1999
- Nikon Corporation
- Jun Suzuki
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Interferometric surface profiler with an alignment optical member
- Patent number 5,563,706
- Issue date Oct 8, 1996
- Nikon Corporation
- Masato Shibuya
- G01 - MEASURING TESTING
Information Patent Grant
Interferometer for observing the interference pattern of a surface...
- Patent number 5,561,525
- Issue date Oct 1, 1996
- Nikon Corporation
- Shuji Toyonaga
- G01 - MEASURING TESTING
Information Patent Grant
Exposure method and apparatus using holographic techniques
- Patent number 5,504,596
- Issue date Apr 2, 1996
- Nikon Corporation
- Akihiro Goto
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Interferometer for measuring aspherical form with the utilization o...
- Patent number 5,039,223
- Issue date Aug 13, 1991
- Kabushiki Kaisha Topcon
- Takashi Gemma
- G01 - MEASURING TESTING
Information Patent Grant
Method of and apparatus for analyzing interference fringes
- Patent number 4,848,907
- Issue date Jul 18, 1989
- Tokyo Kogaku Kikai Kabushiki
- Takashi Yokokura
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Holographic interferometer
- Patent number 4,812,042
- Issue date Mar 14, 1989
- Takashi Yokokura
- G01 - MEASURING TESTING
Information Patent Grant
Holographic interferometer
- Patent number 4,758,089
- Issue date Jul 19, 1988
- Tokyo Kogaku Kikai Kabushiki Kaisha
- Takashi Yokokura
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
METHOD AND DEVICE FOR MEASURING WAVEFRONT, AND EXPOSURE METHOD AND...
- Publication number 20190219451
- Publication date Jul 18, 2019
- Nikon Corporation
- Katsura Otaki
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND DEVICE FOR MEASURING WAVEFRONT, AND EXPOSURE METHOD AND...
- Publication number 20150160073
- Publication date Jun 11, 2015
- Nikon Corporation
- Katsura Otaki
- G01 - MEASURING TESTING
Information Patent Application
Projection optical system inspecting method and inspection apparatu...
- Publication number 20070076181
- Publication date Apr 5, 2007
- Nikon Corporation
- Mikihiko Ishii
- G01 - MEASURING TESTING
Information Patent Application
Projection optical system inspecting method and inspection apparatu...
- Publication number 20060176457
- Publication date Aug 10, 2006
- Nikon Corporation
- Mikihiko Ishii
- G01 - MEASURING TESTING
Information Patent Application
Methods and devices for measuring a surface profile of an optical e...
- Publication number 20040036890
- Publication date Feb 26, 2004
- NIKON CORPORATION
- Shigeru Nakayama
- G01 - MEASURING TESTING
Information Patent Application
Interferometer system and method of manufactruing projection optica...
- Publication number 20020191195
- Publication date Dec 19, 2002
- NIKON CORPORATION
- Hiroshi Ichihara
- G01 - MEASURING TESTING
Information Patent Application
Apparatus and methods for measuring surface profiles and wavefront...
- Publication number 20020012124
- Publication date Jan 31, 2002
- NIKON CORPORATION
- Shigeru Nakayama
- G01 - MEASURING TESTING
Information Patent Application
Interferometer system and method of manufacturing projection optica...
- Publication number 20010028462
- Publication date Oct 11, 2001
- NIKON CORPORATION
- Hiroshi Ichihara
- G01 - MEASURING TESTING

Takashi Gemma

Person

Patents Grantslast 30 patents

Method and device for measuring wavefront using diffraction grating...

Method and device for measuring wavefront using light-exit section...

Projection optical system inspecting method and inspection apparatu...

Projection optical system inspecting method and inspection apparatu...

Interferometer that measures aspherical surfaces

Interferometric apparatus and methods for measuring surface topogra...

Apparatus and methods for detecting and correcting distortion of in...

Apparatus and methods for measuring wavefront aberrations of a micr...

Interferometric surface profiler with an alignment optical member

Interferometer for observing the interference pattern of a surface...

Exposure method and apparatus using holographic techniques

Interferometer for measuring aspherical form with the utilization o...

Method of and apparatus for analyzing interference fringes

Holographic interferometer

Holographic interferometer

Patents Applicationslast 30 patents

METHOD AND DEVICE FOR MEASURING WAVEFRONT, AND EXPOSURE METHOD AND...

METHOD AND DEVICE FOR MEASURING WAVEFRONT, AND EXPOSURE METHOD AND...

Projection optical system inspecting method and inspection apparatu...

Projection optical system inspecting method and inspection apparatu...

Methods and devices for measuring a surface profile of an optical e...

Interferometer system and method of manufactruing projection optica...

Apparatus and methods for measuring surface profiles and wavefront...

Interferometer system and method of manufacturing projection optica...