Takashi Genma

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Tokyo, JP

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Patents Grantslast 30 patents

Information Patent Grant
Shape measurement method and high-precision lens manufacturing process
- Patent number 5,986,760
- Issue date Nov 16, 1999
- Nikon Corporation
- Shigeru Nakayama
- G01 - MEASURING TESTING
Information Patent Grant
Exposure apparatus for reproducing a mask pattern onto a photo-sens...
- Patent number 5,774,240
- Issue date Jun 30, 1998
- Nikon Corporation
- Akihiro Goto
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Exposure apparatus for reproducing a mask pattern onto a photo-sens...
- Patent number 5,528,390
- Issue date Jun 18, 1996
- Nikon Corporation
- Akihiro Goto
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY