Takashi Harada

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Hidaka, JP

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Patents Grantslast 30 patents

Information Patent Grant
Semiconductor integrated circuit having a self-testing function
- Patent number 6,871,311
- Issue date Mar 22, 2005
- Hitachi, Ltd.
- Keiki Watanabe
- G01 - MEASURING TESTING
Information Patent Grant
Communication module having a structure for reducing crosstalk
- Patent number 6,552,407
- Issue date Apr 22, 2003
- Hitachi, Ltd.
- Kiyoshi Hayashi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Optical interconnection receiving module
- Patent number 6,504,140
- Issue date Jan 7, 2003
- Hitachi, Ltd.
- Satoshi Ueno
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Optical transmission apparatus
- Patent number 6,023,363
- Issue date Feb 8, 2000
- Hitachi, Ltd.
- Takashi Harada
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Semiconductor integrated device having parallel signal lines
- Patent number 5,523,622
- Issue date Jun 4, 1996
- Hitachi, Ltd.
- Takashi Harada
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Magazine and a method of storing electronic components
- Patent number 4,171,049
- Issue date Oct 16, 1979
- Hitachi, Ltd.
- Yasumoto Nohara
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
Semiconductor integrated circuit having a self-testing function
- Publication number 20020040459
- Publication date Apr 4, 2002
- Keiki Watanabe
- G01 - MEASURING TESTING
Information Patent Application
Clock producing circuit and semiconductor integrated circuit for co...
- Publication number 20020031148
- Publication date Mar 14, 2002
- Keiki Watanabe
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Semiconductor integrated circuit and optical transfer unit
- Publication number 20020001361
- Publication date Jan 3, 2002
- Hitachi, Ltd.
- Satoshi Ueno
- H03 - BASIC ELECTRONIC CIRCUITRY