Takashi Ishimoto

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Patents Grantslast 30 patents

Information Patent Grant
Semiconductor wafer inspection apparatus and semiconductor wafer in...
- Patent number 9,869,715
- Issue date Jan 16, 2018
- Tokyo Seimitsu Co., Ltd.
- Takashi Ishimoto
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Chip mis-position detection method
- Patent number 7,129,507
- Issue date Oct 31, 2006
- Tokyo Seimitsu Co., Ltd.
- Akira Yamamoto
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Wafer probing machine
- Patent number 6,366,102
- Issue date Apr 2, 2002
- Tokyo Seimitsu Co., Ltd.
- Takashi Ishimoto
- G01 - MEASURING TESTING
Information Patent Grant
Wafer prober
- Patent number 5,568,056
- Issue date Oct 22, 1996
- Tokyo Seimitsu Co., Ltd.
- Takashi Ishimoto
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Semiconductor Wafer Inspection Apparatus And Semiconductor Wafer In...
- Publication number 20170010323
- Publication date Jan 12, 2017
- TOKYO SEIMITSU CO., LTD.
- Takashi ISHIMOTO
- G01 - MEASURING TESTING
Information Patent Application
Chip mis-position detection method
- Publication number 20050173702
- Publication date Aug 11, 2005
- Akira Yamamoto
- H01 - BASIC ELECTRIC ELEMENTS