Takashi Ishimura

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Osaka, JP

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Patents Grantslast 30 patents

Information Patent Grant
Semiconductor integrated circuit and method for testing the same
- Patent number 7,610,533
- Issue date Oct 27, 2009
- Panasonic Corporation
- Takashi Ishimura
- G01 - MEASURING TESTING
Information Patent Grant
Semiconductor integrated circuit and method for testing the same
- Patent number 7,590,908
- Issue date Sep 15, 2009
- Panasonic Corporation
- Takashi Ishimura
- G01 - MEASURING TESTING
Information Patent Grant
Semiconductor integrated circuit and method for testing the same
- Patent number 7,512,853
- Issue date Mar 31, 2009
- Panasonic Corporation
- Takashi Ishimura
Information Patent Grant
Semiconductor integrated circuit and testing method for the same
- Patent number 7,197,725
- Issue date Mar 27, 2007
- Matsushita Electric Industrial Co., Ltd.
- Sadami Takeoka
- G11 - INFORMATION STORAGE

Patents Applicationslast 30 patents

Information Patent Application
SEMICONDUCTOR INTEGRATED CIRCUIT AND METHOD FOR TESTING THE SAME
- Publication number 20090164860
- Publication date Jun 25, 2009
- PANASONIC CORPORATION
- Takashi Ishimura
- G01 - MEASURING TESTING
Information Patent Application
Semiconductor integrated circuit and testing method for the same
- Publication number 20070250284
- Publication date Oct 25, 2007
- Matsushita Electric Industrial Co., Ltd.
- Sadami Takeoka
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
Semiconductor integrated circuit and method of fabricating the same
- Publication number 20070089014
- Publication date Apr 19, 2007
- Takashi Ishimura
- G01 - MEASURING TESTING
Information Patent Application
Logic circuit design support apparatus, and logic circuit design su...
- Publication number 20070083844
- Publication date Apr 12, 2007
- Chie Kabuo
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Semiconductor integrated circuit and method for testing the same
- Publication number 20060174176
- Publication date Aug 3, 2006
- MATSUSHITA ELECTRIC INDUSTRIAL CO., LTD.
- Takashi Ishimura
- G01 - MEASURING TESTING
Information Patent Application
Semiconductor integrated circuit and testing method for the same
- Publication number 20030021464
- Publication date Jan 30, 2003
- Sadami Takeoka
- G01 - MEASURING TESTING