Takashi Iwahashi

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Osaka, JP

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Patents Grantslast 30 patents

Information Patent Grant
Inspection apparatus and inspection method
- Patent number 8,300,921
- Issue date Oct 30, 2012
- Panasonic Corporation
- Takashi Iwahashi
- G01 - MEASURING TESTING
Information Patent Grant
Inspection apparatus and inspection method
- Patent number 8,285,028
- Issue date Oct 9, 2012
- Panasonic Corporation
- Takashi Iwahashi
- G01 - MEASURING TESTING
Information Patent Grant
Component bonding method and component bonding device
- Patent number 7,708,848
- Issue date May 4, 2010
- Panasonic Corporation
- Toshihiko Tsujikawa
- H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR

Patents Applicationslast 30 patents

Information Patent Application
INSPECTION APPARATUS AND INSPECTION METHOD
- Publication number 20100296721
- Publication date Nov 25, 2010
- Takashi Iwahashi
- G01 - MEASURING TESTING
Information Patent Application
INSPECTION APPARATUS AND INSPECTION METHOD
- Publication number 20100220918
- Publication date Sep 2, 2010
- Takashi Iwahashi
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Component Bonding Method and Component Bonding Device
- Publication number 20090011676
- Publication date Jan 8, 2009
- Toshihiko Tsujikawa
- G02 - OPTICS