Takashi Kabumoto

Person

Shiga, JP

People

Patents Grantslast 30 patents

Information Patent Grant
X-ray inspection device
- Patent number 10,859,514
- Issue date Dec 8, 2020
- ISHIDA CO., LTD.
- Atsushi Iwai
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
X-ray apparatus and method of controlling X-ray apparatus
- Patent number 10,531,549
- Issue date Jan 7, 2020
- JOB CORPORATION
- Yoshiharu Obata
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
X-ray generator and X-ray inspection apparatus
- Patent number 10,098,216
- Issue date Oct 9, 2018
- ISHIDA CO., LTD.
- Takashi Kabumoto
- H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information Patent Grant
Inspection device
- Patent number 9,791,591
- Issue date Oct 17, 2017
- ISHIDA CO., LTD.
- Kazuyuki Sugimoto
- B65 - CONVEYING PACKING STORING HANDLING THIN OR FILAMENTARY MATERIAL
Information Patent Grant
Inspection apparatus
- Patent number 8,483,475
- Issue date Jul 9, 2013
- ISHIDA CO., LTD.
- Takashi Kabumoto
- G01 - MEASURING TESTING
Information Patent Grant
X-ray inspection apparatus
- Patent number 8,155,894
- Issue date Apr 10, 2012
- ISHIDA CO., LTD.
- Takashi Kabumoto
- G01 - MEASURING TESTING
Information Patent Grant
X-ray inspection device and production system
- Patent number 8,019,040
- Issue date Sep 13, 2011
- ISHIDA CO., LTD.
- Takashi Kabumoto
- G01 - MEASURING TESTING
Information Patent Grant
X-ray inspection apparatus and X-ray inspection program
- Patent number 7,980,760
- Issue date Jul 19, 2011
- ISHIDA CO., LTD.
- Takashi Kabumoto
- G01 - MEASURING TESTING
Information Patent Grant
X-ray inspection apparatus
- Patent number 7,593,504
- Issue date Sep 22, 2009
- ISHIDA CO., LTD.
- Takashi Kabumoto
- G01 - MEASURING TESTING
Information Patent Grant
X-ray inspection apparatus
- Patent number 7,477,726
- Issue date Jan 13, 2009
- ISHIDA CO., LTD.
- Takashi Kabumoto
- G01 - MEASURING TESTING
Information Patent Grant
Combinational weigher for multiple operations
- Patent number 4,844,190
- Issue date Jul 4, 1989
- Ishida Scales Manufacturing Company, Ltd.
- Yoshiharu Mikami
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
X-RAY GENERATOR AND X-RAY INSPECTION APPARATUS
- Publication number 20180242440
- Publication date Aug 23, 2018
- Ishida Co., Ltd.
- Takashi KABUMOTO
- H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information Patent Application
X-RAY APPARATUS AND METHOD OF CONTROLLING X-RAY APPARATUS
- Publication number 20180063934
- Publication date Mar 1, 2018
- JOB CORPORATION
- Yoshiharu OBATA
- H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information Patent Application
X-RAY INSPECTION DEVICE
- Publication number 20180027640
- Publication date Jan 25, 2018
- Ishida Co., Ltd.
- Atsushi IWAI
- G01 - MEASURING TESTING
Information Patent Application
INSPECTION DEVICE
- Publication number 20160223705
- Publication date Aug 4, 2016
- ISHIDA CO., LTD.
- Kazuyuki SUGIMOTO
- G01 - MEASURING TESTING
Information Patent Application
INSPECTION APPARATUS
- Publication number 20100202694
- Publication date Aug 12, 2010
- ISHIDA CO., LTD.
- Takashi Kabumoto
- G01 - MEASURING TESTING
Information Patent Application
X-RAY INSPECTION DEVICE AND PRODUCTION SYSTEM
- Publication number 20100135459
- Publication date Jun 3, 2010
- ISHIDA CO., LTD.
- Takashi Kabumoto
- G01 - MEASURING TESTING
Information Patent Application
X-RAY INSPECTION APPARATUS
- Publication number 20100057380
- Publication date Mar 4, 2010
- ISHIDA CO., LTD.
- Takashi KABUMOTO
- G01 - MEASURING TESTING
Information Patent Application
X-RAY INSPECTION APPARATUS AND X-RAY INSPECTION PROGRAM
- Publication number 20100002835
- Publication date Jan 7, 2010
- ISHIDA CO., LTD.
- Takashi Kabumoto
- G01 - MEASURING TESTING
Information Patent Application
X-RAY INSPECTION APPARATUS
- Publication number 20080298547
- Publication date Dec 4, 2008
- ISHIDA CO., LTD.
- Takashi KABUMOTO
- G01 - MEASURING TESTING
Information Patent Application
X-Ray Inspection Apparatus
- Publication number 20080063148
- Publication date Mar 13, 2008
- ISHIDA CO., LTD.
- Takashi Kabumoto
- G01 - MEASURING TESTING

Takashi Kabumoto

Person

Patents Grantslast 30 patents

X-ray inspection device

X-ray apparatus and method of controlling X-ray apparatus

X-ray generator and X-ray inspection apparatus

Inspection device

Inspection apparatus

X-ray inspection apparatus

X-ray inspection device and production system

X-ray inspection apparatus and X-ray inspection program

X-ray inspection apparatus

X-ray inspection apparatus

Combinational weigher for multiple operations

Patents Applicationslast 30 patents

X-RAY GENERATOR AND X-RAY INSPECTION APPARATUS

X-RAY APPARATUS AND METHOD OF CONTROLLING X-RAY APPARATUS

X-RAY INSPECTION DEVICE

INSPECTION DEVICE

INSPECTION APPARATUS

X-RAY INSPECTION DEVICE AND PRODUCTION SYSTEM

X-RAY INSPECTION APPARATUS

X-RAY INSPECTION APPARATUS AND X-RAY INSPECTION PROGRAM

X-RAY INSPECTION APPARATUS

X-Ray Inspection Apparatus