Takashi Kaito

Person

Tokyo, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Method of manufacturing sample for atom probe analysis by FIB and f...
- Patent number 8,728,286
- Issue date May 20, 2014
- Sii Nano Technology Inc.
- Takashi Kaito
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Composite focused ion beam device, process observation method using...
- Patent number 8,274,063
- Issue date Sep 25, 2012
- SII NanoTechnology Inc.
- Takashi Kaito
- G01 - MEASURING TESTING
Information Patent Grant
Composite focused ion beam device, and processing observation metho...
- Patent number 8,269,194
- Issue date Sep 18, 2012
- SII NanoTechnology Inc.
- Takashi Kaito
- G01 - MEASURING TESTING
Information Patent Grant
Atom probe apparatus and method for working sample preliminary for...
- Patent number 7,550,723
- Issue date Jun 23, 2009
- SII NanoTechnology Inc.
- Takashi Kaito
- G01 - MEASURING TESTING
Information Patent Grant
Working method utilizing irradiation of charged particle beam onto...
- Patent number 7,511,289
- Issue date Mar 31, 2009
- SII NanoTechnology Inc.
- Takashi Kaito
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method for fabricating nanometer-scale structure
- Patent number 7,476,418
- Issue date Jan 13, 2009
- SII NanoTechnology Inc.
- Masatoshi Yasutake
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for manufacturing ultra fine three-dimensional...
- Patent number 7,326,445
- Issue date Feb 5, 2008
- SII NanoTechnology Inc.
- Takashi Kaito
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Grant
Gas blowing nozzle of charged particle beam apparatus and charged p...
- Patent number 7,235,783
- Issue date Jun 26, 2007
- SII NanoTechnology Inc.
- Takashi Kaito
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Probe for scanning probe microscope
- Patent number 6,864,481
- Issue date Mar 8, 2005
- SII NanoTechnology Inc.
- Takashi Kaito
- G01 - MEASURING TESTING
Information Patent Grant
Scanning atom probe
- Patent number 6,797,952
- Issue date Sep 28, 2004
- SII NanoTechnology Inc.
- Takashi Kaito
- G01 - MEASURING TESTING
Information Patent Grant
Beam shaped film pattern formation method
- Patent number 6,740,368
- Issue date May 25, 2004
- SII NanoTechnology Inc.
- Takashi Kaito
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Grant
Method for forming a vertical edge submicron through-hole and a thi...
- Patent number 6,544,897
- Issue date Apr 8, 2003
- Seiko Instruments Inc.
- Takashi Kaito
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Micromachining method for workpiece observation
- Patent number 6,395,347
- Issue date May 28, 2002
- Seiko Instruments Inc.
- Tatsuya Adachi
- G01 - MEASURING TESTING
Information Patent Grant
Focused charged beam apparatus, and its processing and observation...
- Patent number 5,525,806
- Issue date Jun 11, 1996
- Seiko Instruments Inc.
- Koji Iwasaki
- G01 - MEASURING TESTING
Information Patent Grant
Analysis of integrated circuit operability using a focused ion beam
- Patent number 5,376,883
- Issue date Dec 27, 1994
- Seiko Instruments Inc.
- Takashi Kaito
- G01 - MEASURING TESTING
Information Patent Grant
Process for forming pattern films
- Patent number 5,071,671
- Issue date Dec 10, 1991
- Seiko Instruments Inc.
- Yoshitomo Nakagawa
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Preparation and observation method of micro-section
- Patent number 5,028,780
- Issue date Jul 2, 1991
- Seiko Instruments, Inc.
- Takashi Kaito
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus for preparation and observation of a topographic section
- Patent number 5,023,453
- Issue date Jun 11, 1991
- Seiko Instruments, Inc.
- Tatsuya Adachi
- G01 - MEASURING TESTING
Information Patent Grant
Process for repairing pattern film
- Patent number 4,950,498
- Issue date Aug 21, 1990
- Seiko Instruments Inc.
- Takashi Kaito
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Mask-repairing device
- Patent number 4,930,439
- Issue date Jun 5, 1990
- Seiko Instruments Inc.
- Mitsuyoshi Sato
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Grant
Process for forming metallic patterned film
- Patent number 4,876,112
- Issue date Oct 24, 1989
- Seiko Instruments Inc.
- Takashi Kaito
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Grant
Process for forming pattern film
- Patent number 4,874,632
- Issue date Oct 17, 1989
- Seiko Instruments, Inc.
- Yoshitomo Nakagawa
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Apparatus of regulating shape of focused ion beams
- Patent number 4,704,526
- Issue date Nov 3, 1987
- Seiko Instruments & Electronics Ltd.
- Hideaki Kyogoku
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY

Patents Applicationslast 30 patents

Information Patent Application
COMPOSITE FOCUSED ION BEAM DEVICE, PROCESS OBSERVATION METHOD USING...
- Publication number 20100288924
- Publication date Nov 18, 2010
- Takashi Kaito
- G01 - MEASURING TESTING
Information Patent Application
COMPOSITE FOCUSED ION BEAM DEVICE, AND PROCESSING OBSERVATION METHO...
- Publication number 20100176296
- Publication date Jul 15, 2010
- Takashi Kaito
- G01 - MEASURING TESTING
Information Patent Application
Method for forming ultra-high strength elastic diamond like carbon...
- Publication number 20050066882
- Publication date Mar 31, 2005
- Jun-ichi Fujita
- B81 - MICRO-STRUCTURAL TECHNOLOGY

Takashi Kaito

Person

Patents Grantslast 30 patents

Method of manufacturing sample for atom probe analysis by FIB and f...

Composite focused ion beam device, process observation method using...

Composite focused ion beam device, and processing observation metho...

Atom probe apparatus and method for working sample preliminary for...

Working method utilizing irradiation of charged particle beam onto...

Method for fabricating nanometer-scale structure

Method and apparatus for manufacturing ultra fine three-dimensional...

Gas blowing nozzle of charged particle beam apparatus and charged p...

Probe for scanning probe microscope

Scanning atom probe

Beam shaped film pattern formation method

Method for forming a vertical edge submicron through-hole and a thi...

Micromachining method for workpiece observation

Focused charged beam apparatus, and its processing and observation...

Analysis of integrated circuit operability using a focused ion beam

Process for forming pattern films

Preparation and observation method of micro-section

Apparatus for preparation and observation of a topographic section

Process for repairing pattern film

Mask-repairing device

Process for forming metallic patterned film

Process for forming pattern film

Apparatus of regulating shape of focused ion beams

Patents Applicationslast 30 patents

COMPOSITE FOCUSED ION BEAM DEVICE, PROCESS OBSERVATION METHOD USING...

COMPOSITE FOCUSED ION BEAM DEVICE, AND PROCESSING OBSERVATION METHO...

Method for forming ultra-high strength elastic diamond like carbon...