Takashi Kaito

Person

Chiba-shi, JP

People

Patents Applicationslast 30 patents

Information Patent Application
Method of Manufacturing Sample for Atom Probe Analysis by FIB and F...
- Publication number 20080289954
- Publication date Nov 27, 2008
- Takashi Kaito
- G01 - MEASURING TESTING
Information Patent Application
Gas blowing nozzle of charged particle beam apparatus and charged p...
- Publication number 20070205376
- Publication date Sep 6, 2007
- Takashi Kaito
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Atom probe apparatus and method for working sample preliminarily fo...
- Publication number 20070176099
- Publication date Aug 2, 2007
- Takashi Kaito
- G01 - MEASURING TESTING
Information Patent Application
Processing probe, processing apparatus, and method of manufacturing...
- Publication number 20060192114
- Publication date Aug 31, 2006
- Tatsuya Adachi
- G01 - MEASURING TESTING
Information Patent Application
Gas blowingnozzle of charged particle beam apparatus and charged pa...
- Publication number 20050167614
- Publication date Aug 4, 2005
- Takashi Kaito
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Method for fabricating nanometer-scale structure
- Publication number 20050089463
- Publication date Apr 28, 2005
- Masatoshi Yasutake
- D01 - NATURAL OR ARTIFICIAL THREADS OR FIBRES SPINNING
Information Patent Application
Electrochemical cell
- Publication number 20040209163
- Publication date Oct 21, 2004
- Shunji Watanabe
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Method and system for surface or cross-sectional processing and obs...
- Publication number 20040154744
- Publication date Aug 12, 2004
- Takashi Kaito
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information Patent Application
Method and apparatus for manufacturing ultra fine three-dimensional...
- Publication number 20030161970
- Publication date Aug 28, 2003
- Takashi Kaito
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Application
Probe for scanning probe microscope
- Publication number 20030122072
- Publication date Jul 3, 2003
- Takashi Kaito
- G01 - MEASURING TESTING
Information Patent Application
Scanning atom probe
- Publication number 20030066962
- Publication date Apr 10, 2003
- Takashi Kaito
- B82 - NANO-TECHNOLOGY
Information Patent Application
Beam shaped film pattern formation method
- Publication number 20020127352
- Publication date Sep 12, 2002
- Takashi Kaito
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Application
Method for forming a vertical edge submicron through-hole and a thi...
- Publication number 20020081507
- Publication date Jun 27, 2002
- Takashi Kaito
- H01 - BASIC ELECTRIC ELEMENTS

Takashi Kaito

Person

Patents Applicationslast 30 patents

Method of Manufacturing Sample for Atom Probe Analysis by FIB and F...

Gas blowing nozzle of charged particle beam apparatus and charged p...

Atom probe apparatus and method for working sample preliminarily fo...

Processing probe, processing apparatus, and method of manufacturing...

Gas blowingnozzle of charged particle beam apparatus and charged pa...

Method for fabricating nanometer-scale structure

Electrochemical cell

Method and system for surface or cross-sectional processing and obs...

Method and apparatus for manufacturing ultra fine three-dimensional...

Probe for scanning probe microscope

Scanning atom probe

Beam shaped film pattern formation method

Method for forming a vertical edge submicron through-hole and a thi...