Takashi KANAI

Follow

Person

Atsugi-shi, JP

People

Patents Grantslast 30 patents

Information Patent Grant
X-ray inspection apparatus and correction method for X-ray inspecti...
- Patent number 10,718,725
- Issue date Jul 21, 2020
- ANRITSU INFIVIS CO., LTD.
- Itaru Miyazaki
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
X-ray inspection device
- Patent number 10,292,251
- Issue date May 14, 2019
- ANRITSU INFIVIS CO., LTD.
- Toshiaki Kikuchi
- H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR

Patents Applicationslast 30 patents

Information Patent Application
X-RAY INSPECTION APPARATUS
- Publication number 20240068961
- Publication date Feb 29, 2024
- Anritsu Corporation
- Takeshi YAMAZAKI
- G01 - MEASURING TESTING
Information Patent Application
X-RAY INSPECTION APPARATUS AND CORRECTION METHOD FOR X-RAY INSPECTI...
- Publication number 20190003989
- Publication date Jan 3, 2019
- ANRITSU INFIVIS CO., LTD.
- Itaru MIYAZAKI
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
X-RAY INSPECTION DEVICE
- Publication number 20170171953
- Publication date Jun 15, 2017
- ANRITSU INFIVIS CO., LTD.
- Toshiaki KIKUCHI
- G01 - MEASURING TESTING