Takashi Karashima

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Kanagawa, JP

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Patents Grantslast 30 patents

Information Patent Grant
Semiconductor device including a chip capacitor mounted on a wiring...
- Patent number 10,950,686
- Issue date Mar 16, 2021
- Renesas Electronics Corporation
- Takashi Karashima
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor device
- Patent number 9,728,487
- Issue date Aug 8, 2017
- Renesas Electronics Corporation
- Takashi Karashima
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method of inspecting semiconductor device
- Patent number 8,605,277
- Issue date Dec 10, 2013
- Renesas Electronics Corporation
- Satoshi Yamada
- G01 - MEASURING TESTING
Information Patent Grant
Method of manufacturing semiconductor device
- Patent number 8,580,620
- Issue date Nov 12, 2013
- Renesas Electronics Corporation
- Kazuyuki Nakagawa
- H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR

Patents Applicationslast 30 patents

Information Patent Application
SEMICONDUCTOR DEVICE
- Publication number 20230352382
- Publication date Nov 2, 2023
- RENESAS ELECTRONICS CORPORATION
- Takashi KARASHIMA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SEMICONDUCTOR DEVICE
- Publication number 20190363157
- Publication date Nov 28, 2019
- RENESAS ELECTRONICS CORPORATION
- Takashi KARASHIMA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SEMICONDUCTOR DEVICE
- Publication number 20160343755
- Publication date Nov 24, 2016
- RENESAS ELECTRONICS CORPORATION
- Takashi KARASHIMA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD OF INSPECTING SEMICONDUCTOR DEVICE
- Publication number 20120081702
- Publication date Apr 5, 2012
- Renesas Electronics Corporation
- Satoshi YAMADA
- G01 - MEASURING TESTING
Information Patent Application
METHOD OF MANUFACTURING SEMICONDUCTOR DEVICE
- Publication number 20110039375
- Publication date Feb 17, 2011
- Renesas Electronics Corporation
- Kazuyuki Nakagawa
- H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR