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Takashi Kasahara

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  • Shizuoka, JP
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Patents Grantslast 30 patents

  • Information Patent Grant

    Suctioning method
    • Patent number 11,947,140
    • Issue date Apr 2, 2024
    • Hamamatsu Photonics K.K.
    • Masaki Hirose
    • B25 - HAND TOOLS PORTABLE POWER-DRIVEN TOOLS MANIPULATORS
  • Information Patent Grant

    Suction method
    • Patent number 11,865,701
    • Issue date Jan 9, 2024
    • Hamamatsu Photonics K.K.
    • Masaki Hirose
    • G02 - OPTICS
  • Information Patent Grant

    Light detection device
    • Patent number 11,835,388
    • Issue date Dec 5, 2023
    • Hamamatsu Photonics K.K.
    • Masaki Hirose
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Grant

    Wafer inspection method and wafer
    • Patent number 11,624,902
    • Issue date Apr 11, 2023
    • Hamamatsu Photonics K.K.
    • Yumi Kuramoto
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Grant

    Wafer
    • Patent number 11,609,420
    • Issue date Mar 21, 2023
    • Hamamatsu Photonics K.K.
    • Toshimitsu Kawai
    • G02 - OPTICS
  • Information Patent Grant

    Transportation method
    • Patent number 11,592,332
    • Issue date Feb 28, 2023
    • Hamamatsu Photonics K.K.
    • Hiroki Oyama
    • B65 - CONVEYING PACKING STORING HANDLING THIN OR FILAMENTARY MATERIAL
  • Information Patent Grant

    Transportation method
    • Patent number 11,555,740
    • Issue date Jan 17, 2023
    • Hamamatsu Photonics K.K.
    • Hiroki Oyama
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Grant

    Optical detection device having adhesive member
    • Patent number 11,555,741
    • Issue date Jan 17, 2023
    • Hamamatsu Photonics K.K.
    • Masaki Hirose
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Optical filter system
    • Patent number 11,480,783
    • Issue date Oct 25, 2022
    • Hamamatsu Photonics K.K.
    • Helmut Teichmann
    • G02 - OPTICS
  • Information Patent Grant

    Wafer
    • Patent number 11,448,869
    • Issue date Sep 20, 2022
    • Hamamatsu Photonics K.K.
    • Toshimitsu Kawai
    • G02 - OPTICS
  • Information Patent Grant

    Light detection device
    • Patent number 11,448,553
    • Issue date Sep 20, 2022
    • Hamamatsu Photonics K.K.
    • Masaki Hirose
    • G02 - OPTICS
  • Information Patent Grant

    Optical inspection device and optical inspection method
    • Patent number 11,422,059
    • Issue date Aug 23, 2022
    • Hamamatsu Photonics K.K.
    • Takashi Kasahara
    • G02 - OPTICS
  • Information Patent Grant

    Method for removing foreign matter and method for manufacturing opt...
    • Patent number 11,294,170
    • Issue date Apr 5, 2022
    • Hamamatsu Photonics K.K.
    • Masaki Hirose
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Grant

    Optical measurement control program, optical measurement system, an...
    • Patent number 11,156,500
    • Issue date Oct 26, 2021
    • Hamamatsu Photonics K.K.
    • Takashi Kasahara
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Optical detection device having adhesive member
    • Patent number 11,118,972
    • Issue date Sep 14, 2021
    • Hamamatsu Photonics K.K.
    • Masaki Hirose
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Fabry-Perot interference filter and light-detecting device
    • Patent number 11,054,560
    • Issue date Jul 6, 2021
    • Hamamatsu Photonics K.K.
    • Toshimitsu Kawai
    • G02 - OPTICS
  • Information Patent Grant

    Production method for Fabry-Perot interference filter
    • Patent number 11,041,755
    • Issue date Jun 22, 2021
    • Hamamatsu Photonics K.K.
    • Takashi Kasahara
    • B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
  • Information Patent Grant

    Light detection device
    • Patent number 11,035,726
    • Issue date Jun 15, 2021
    • Hamamatsu Photonics K.K.
    • Takashi Kasahara
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Light detecting device
    • Patent number 10,935,419
    • Issue date Mar 2, 2021
    • Hamamatsu Photonics K.K.
    • Masaki Hirose
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Production method for fabry-perot interference filter
    • Patent number 10,908,022
    • Issue date Feb 2, 2021
    • Hamamatsu Photonics K.K.
    • Takashi Kasahara
    • B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
  • Information Patent Grant

    Fabry-Perot interference filter having layer with thinned edge port...
    • Patent number 10,900,834
    • Issue date Jan 26, 2021
    • Hamamatsu Photonics K.K.
    • Takashi Kasahara
    • B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
  • Information Patent Grant

    Light-detecting device
    • Patent number 10,895,501
    • Issue date Jan 19, 2021
    • Hamamatsu Photonics K.K.
    • Katsumi Shibayama
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Fabry-Perot interference filter
    • Patent number 10,838,195
    • Issue date Nov 17, 2020
    • Hamamatsu Photonics K.K.
    • Takashi Kasahara
    • B81 - MICRO-STRUCTURAL TECHNOLOGY
  • Information Patent Grant

    Light-detecting device
    • Patent number 10,775,238
    • Issue date Sep 15, 2020
    • Hamamatsu Photonics K.K.
    • Katsumi Shibayama
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Fabry-Perot interference filter
    • Patent number 10,724,902
    • Issue date Jul 28, 2020
    • Hamamatsu Photonics K.K.
    • Takashi Kasahara
    • B81 - MICRO-STRUCTURAL TECHNOLOGY
  • Information Patent Grant

    Light detection device
    • Patent number 10,656,020
    • Issue date May 19, 2020
    • Hamamatsu Photonics K.K.
    • Masaki Hirose
    • G02 - OPTICS
  • Information Patent Grant

    Fabry-Perot interference filter
    • Patent number 10,591,715
    • Issue date Mar 17, 2020
    • Hamamatsu Photonics K.K.
    • Katsumi Shibayama
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Spectrometer
    • Patent number D839117
    • Issue date Jan 29, 2019
    • Hamamatsu Photonics K.K.
    • Masaki Hirose
    • D10 - Measuring, testing, or signalling instruments
  • Information Patent Grant

    Spectrometer
    • Patent number D839116
    • Issue date Jan 29, 2019
    • Hamamatsu Photonics K.K.
    • Masaki Hirose
    • D10 - Measuring, testing, or signalling instruments
  • Information Patent Grant

    Fabry-Perot interference filter
    • Patent number 10,185,140
    • Issue date Jan 22, 2019
    • Hamamatsu Photonics K.K.
    • Katsumi Shibayama
    • G02 - OPTICS

Patents Applicationslast 30 patents

  • Information Patent Application

    LIGHT DETECTION DEVICE
    • Publication number 20240019304
    • Publication date Jan 18, 2024
    • HAMAMATSU PHOTONICS K. K.
    • Masaki HIROSE
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Application

    TRANSPORTATION METHOD
    • Publication number 20230122733
    • Publication date Apr 20, 2023
    • HAMAMATSU PHOTONICS K. K.
    • Hiroki OYAMA
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Application

    TRANSPORTATION METHOD
    • Publication number 20230118479
    • Publication date Apr 20, 2023
    • HAMAMATSU PHOTONICS K. K.
    • Hiroki OYAMA
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Application

    WAFER
    • Publication number 20220350131
    • Publication date Nov 3, 2022
    • HAMAMATSU PHOTONICS K.K.
    • Toshimitsu KAWAI
    • G02 - OPTICS
  • Information Patent Application

    LIGHT DETECTION DEVICE
    • Publication number 20220333988
    • Publication date Oct 20, 2022
    • HAMAMATSU PHOTONICS K. K.
    • Masaki HIROSE
    • G01 - MEASURING TESTING
  • Information Patent Application

    OPTICAL FILTER DEVICE AND METHOD FOR CONTROLLING OPTICAL FILTER DEVICE
    • Publication number 20220026703
    • Publication date Jan 27, 2022
    • Hamamatsu Photonics K.K.
    • Takashi KASAHARA
    • G02 - OPTICS
  • Information Patent Application

    CONTROL DEVICE, OPTICAL FILTER SYSTEM, AND CONTROL METHOD
    • Publication number 20220003603
    • Publication date Jan 6, 2022
    • Hamamatsu Photonics K.K.
    • Peter SEITZ
    • G01 - MEASURING TESTING
  • Information Patent Application

    LIGHT DETECTION DEVICE
    • Publication number 20210396579
    • Publication date Dec 23, 2021
    • Hamamatsu Photonics K.K.
    • Hiroki OYAMA
    • G01 - MEASURING TESTING
  • Information Patent Application

    OPTICAL DETECTION DEVICE HAVING ADHESIVE MEMBER
    • Publication number 20210372854
    • Publication date Dec 2, 2021
    • HAMAMATSU PHOTONICS K. K.
    • Masaki HIROSE
    • G02 - OPTICS
  • Information Patent Application

    SUCTION METHOD
    • Publication number 20210362351
    • Publication date Nov 25, 2021
    • Hamamatsu Photonics K.K.
    • Masaki HIROSE
    • B25 - HAND TOOLS PORTABLE POWER-DRIVEN TOOLS MANIPULATORS
  • Information Patent Application

    SUCTIONING METHOD
    • Publication number 20210364681
    • Publication date Nov 25, 2021
    • Hamamatsu Photonics K.K.
    • Masaki HIROSE
    • G02 - OPTICS
  • Information Patent Application

    PRODUCTION METHOD FOR FABRY-PEROT INTERFERENCE FILTER
    • Publication number 20210131870
    • Publication date May 6, 2021
    • HAMAMATSU PHOTONICS K. K.
    • Takashi KASAHARA
    • B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
  • Information Patent Application

    LIGHT DETECTION DEVICE
    • Publication number 20210116297
    • Publication date Apr 22, 2021
    • Hamamatsu Photonics K.K.
    • Takashi KASAHARA
    • G02 - OPTICS
  • Information Patent Application

    METHOD FOR REMOVING FOREIGN MATTER AND METHOD FOR MANUFACTURING OPT...
    • Publication number 20200310112
    • Publication date Oct 1, 2020
    • Hamamatsu Photonics K.K.
    • Masaki HIROSE
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Application

    WAFER
    • Publication number 20200310105
    • Publication date Oct 1, 2020
    • Hamamatsu Photonics K.K.
    • Toshimitsu KAWAI
    • G02 - OPTICS
  • Information Patent Application

    ELECTRICAL INSPECTION METHOD
    • Publication number 20200309637
    • Publication date Oct 1, 2020
    • Hamamatsu Photonics K.K.
    • Takashi KASAHARA
    • G01 - MEASURING TESTING
  • Information Patent Application

    WAFER INSPECTION METHOD AND WAFER
    • Publication number 20200310104
    • Publication date Oct 1, 2020
    • Hamamatsu Photonics K.K.
    • Yumi KURAMOTO
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Application

    TRANSPORTATION METHOD
    • Publication number 20200292386
    • Publication date Sep 17, 2020
    • Hamamatsu Photonics K.K.
    • Hiroki OYAMA
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Application

    OPTICAL INSPECTION DEVICE AND OPTICAL INSPECTION METHOD
    • Publication number 20200278272
    • Publication date Sep 3, 2020
    • Hamamatsu Photonics K.K.
    • Takashi KASAHARA
    • G01 - MEASURING TESTING
  • Information Patent Application

    LIGHT DETECTION DEVICE
    • Publication number 20200232852
    • Publication date Jul 23, 2020
    • HAMAMATSU PHOTONICS K. K.
    • Masaki HIROSE
    • G02 - OPTICS
  • Information Patent Application

    OPTICAL MEASUREMENT CONTROL PROGRAM, OPTICAL MEASUREMENT SYSTEM, AN...
    • Publication number 20200191652
    • Publication date Jun 18, 2020
    • Hamamatsu Photonics K.K.
    • Takashi KASAHARA
    • G01 - MEASURING TESTING
  • Information Patent Application

    PRODUCTION METHOD FOR FABRY-PEROT INTERFERENCE FILTER
    • Publication number 20200141801
    • Publication date May 7, 2020
    • Hamamatsu Photonics K.K.
    • Takashi KASAHARA
    • B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
  • Information Patent Application

    OPTICAL FILTER SYSTEM
    • Publication number 20200116992
    • Publication date Apr 16, 2020
    • Hamamatsu Photonics K.K.
    • Helmut TEICHMANN
    • G02 - OPTICS
  • Information Patent Application

    LIGHT DETECTING DEVICE
    • Publication number 20200103273
    • Publication date Apr 2, 2020
    • Hamamatsu Photonics K.K.
    • Masaki HIROSE
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Application

    LIGHT-DETECTING DEVICE
    • Publication number 20200056940
    • Publication date Feb 20, 2020
    • HAMAMATSU PHOTONICS K. K.
    • Katsumi SHIBAYAMA
    • G01 - MEASURING TESTING
  • Information Patent Application

    FABRY-PEROT INTERFERENCE FILTER AND PRODUCTION METHOD FOR FABRY-PER...
    • Publication number 20190204150
    • Publication date Jul 4, 2019
    • Hamamatsu Photonics K.K.
    • Takashi KASAHARA
    • B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
  • Information Patent Application

    FABRY-PEROT INTERFERENCE FILTER
    • Publication number 20190186994
    • Publication date Jun 20, 2019
    • Hamamatsu Photonics K.K.
    • Takashi KASAHARA
    • G02 - OPTICS
  • Information Patent Application

    FABRY-PEROT INTERFERENCE FILTER
    • Publication number 20190179131
    • Publication date Jun 13, 2019
    • Hamamatsu Photonics K.K.
    • Takashi KASAHARA
    • G02 - OPTICS
  • Information Patent Application

    LIGHT DETECTION DEVICE
    • Publication number 20190072431
    • Publication date Mar 7, 2019
    • Hamamatsu Photonics K.K.
    • Masaki HIROSE
    • G02 - OPTICS
  • Information Patent Application

    PRODUCTION METHOD FOR FABRY-PEROT INTERFERENCE FILTER
    • Publication number 20180373021
    • Publication date Dec 27, 2018
    • Hamamatsu Photonics K.K.
    • Takashi KASAHARA
    • B81 - MICRO-STRUCTURAL TECHNOLOGY