Takashi Kawahito

Person

Kanagawa, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Microscope apparatus and storage medium storing microscope apparatu...
- Patent number 10,241,314
- Issue date Mar 26, 2019
- Nikon Corporation
- Yumiko Ouchi
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Microscope apparatus and storage medium storing microscope apparatu...
- Patent number 9,261,699
- Issue date Feb 16, 2016
- Nikon Corporation
- Yumiko Ouchi
- G02 - OPTICS
Information Patent Grant
Objective lens, nosepiece and inverted microscope equipped therewith
- Patent number 8,284,481
- Issue date Oct 9, 2012
- Nikon Corporation
- Takashi Kawahito
- G02 - OPTICS
Information Patent Grant
Environment holding apparatus and environment control type analyzer
- Patent number 8,066,962
- Issue date Nov 29, 2011
- Nikon Corporation
- Takashi Kawahito
- G01 - MEASURING TESTING
Information Patent Grant
Microscope
- Patent number 7,957,058
- Issue date Jun 7, 2011
- National University Corporation Nara Institute of Science and Technology
- Tadao Sugiura
- G02 - OPTICS
Information Patent Grant
Automatic focus detection device and microscope system having the same
- Patent number 7,843,634
- Issue date Nov 30, 2010
- Nikon Corporation
- Takashi Kawahito
- G02 - OPTICS
Information Patent Grant
Microscope apparatus
- Patent number 7,742,227
- Issue date Jun 22, 2010
- Nikon Corporation
- Takashi Kawahito
- G02 - OPTICS
Information Patent Grant
Inverted microscope
- Patent number 6,404,546
- Issue date Jun 11, 2002
- Nikon Corporation
- Shuji Toyoda
- G02 - OPTICS
Information Patent Grant
Microscope turret assembly and a microscope
- Patent number 6,313,944
- Issue date Nov 6, 2001
- Nikon Corporation
- Takashi Kawahito
- G02 - OPTICS
Information Patent Grant
Inverted microscope with objective lens view opening and method for...
- Patent number 6,268,959
- Issue date Jul 31, 2001
- Nikon Corporation
- Takashi Kawahito
- G02 - OPTICS
Information Patent Grant
Inverted microscope
- Patent number 6,239,905
- Issue date May 29, 2001
- Nikon Corporation
- Shuji Toyoda
- G02 - OPTICS
Information Patent Grant
Methods and apparatus for measuring stress and strain characteristi...
- Patent number 5,723,793
- Issue date Mar 3, 1998
- Nikon Corporation
- Yoshihiko Suzuki
- G01 - MEASURING TESTING
Information Patent Grant
Differential interference microscope apparatus and an observing met...
- Patent number 5,572,359
- Issue date Nov 5, 1996
- Nikon Corporation
- Tatsuro Otaki
- G02 - OPTICS

Patents Applicationslast 30 patents

Information Patent Application
MICROSCOPE APPARATUS AND STORAGE MEDIUM STORING MICROSCOPE APPARATU...
- Publication number 20160116727
- Publication date Apr 28, 2016
- Nikon Corporation
- Yumiko Ouchi
- G02 - OPTICS
Information Patent Application
Microscope apparatus and storage medium storing microscope apparatu...
- Publication number 20110141260
- Publication date Jun 16, 2011
- Nikon Corporation
- Yumiko Ouchi
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
MICROSCOPE
- Publication number 20100142038
- Publication date Jun 10, 2010
- Tadao Sugiura
- G02 - OPTICS
Information Patent Application
OBJECTIVE LENS, NOSEPIECE AND INVERTED MICROSCOPE EQUIPPED THEREWITH
- Publication number 20100091363
- Publication date Apr 15, 2010
- NIKON CORPORATION
- TAKASHI KAWAHITO
- G02 - OPTICS
Information Patent Application
MICROSCOPE APPARATUS
- Publication number 20090116103
- Publication date May 7, 2009
- NIKON CORPORATION
- Takashi KAWAHITO
- G02 - OPTICS
Information Patent Application
ENVIRONMENT MAINTAINING APPARATUS FOR MICROSCOPE AND MICROSCOPE
- Publication number 20090086316
- Publication date Apr 2, 2009
- NIKON CORPORATION
- Takashi KAWAHITO
- G02 - OPTICS
Information Patent Application
Environment holding apparatus and environment control type analyzer
- Publication number 20060245976
- Publication date Nov 2, 2006
- NIKON CORPORATION
- Takashi Kawahito
- G01 - MEASURING TESTING
Information Patent Application
Automatic focus detection device and microscope system having the same
- Publication number 20060039064
- Publication date Feb 23, 2006
- NIKON CORPORATION
- TAKASHI KAWAHITO
- G02 - OPTICS
Information Patent Application
Inverted microscope
- Publication number 20010021064
- Publication date Sep 13, 2001
- Shuji Toyoda
- G02 - OPTICS
Information Patent Application
MICROSCOPE TURRET ASSEMBLY AND A MICROSCOPE
- Publication number 20010012150
- Publication date Aug 9, 2001
- NIKON CORPORATION
- TAKASHI KAWAHITO
- G02 - OPTICS

Takashi Kawahito

Person

Patents Grantslast 30 patents

Microscope apparatus and storage medium storing microscope apparatu...

Microscope apparatus and storage medium storing microscope apparatu...

Objective lens, nosepiece and inverted microscope equipped therewith

Environment holding apparatus and environment control type analyzer

Microscope

Automatic focus detection device and microscope system having the same

Microscope apparatus

Inverted microscope

Microscope turret assembly and a microscope

Inverted microscope with objective lens view opening and method for...

Inverted microscope

Methods and apparatus for measuring stress and strain characteristi...

Differential interference microscope apparatus and an observing met...

Patents Applicationslast 30 patents

MICROSCOPE APPARATUS AND STORAGE MEDIUM STORING MICROSCOPE APPARATU...

Microscope apparatus and storage medium storing microscope apparatu...

MICROSCOPE

OBJECTIVE LENS, NOSEPIECE AND INVERTED MICROSCOPE EQUIPPED THEREWITH

MICROSCOPE APPARATUS

ENVIRONMENT MAINTAINING APPARATUS FOR MICROSCOPE AND MICROSCOPE

Environment holding apparatus and environment control type analyzer

Automatic focus detection device and microscope system having the same

Inverted microscope

MICROSCOPE TURRET ASSEMBLY AND A MICROSCOPE