Takashi Kinoshita

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Kyoto, JP

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Patents Grantslast 30 patents

Information Patent Grant
Device for and method of inspecting surface condition having differ...
- Patent number 7,782,451
- Issue date Aug 24, 2010
- Omron Corporation
- Toshihiko Matsumoto
- G01 - MEASURING TESTING
Information Patent Grant
Substrate inspection method and apparatus
- Patent number 7,512,260
- Issue date Mar 31, 2009
- Omron Corporation
- Kiyoshi Murakami
- G06 - COMPUTING CALCULATING COUNTING

Patents Applicationslast 30 patents

Information Patent Application
Device for and method of inspecting surface condition
- Publication number 20070211240
- Publication date Sep 13, 2007
- OMRON CORPORATION
- Toshihiko Matsumoto
- G01 - MEASURING TESTING
Information Patent Application
Substrate inspection method and apparatus
- Publication number 20060050267
- Publication date Mar 9, 2006
- Kiyoshi Murakami
- G06 - COMPUTING CALCULATING COUNTING