Takashi Kitagaki

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Tokyo, JP

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Patents Grantslast 30 patents

Information Patent Grant
Apparatus and associated methods for monitoring noise level of a si...
- Patent number 10,228,397
- Issue date Mar 12, 2019
- Keysight Technologies, Inc.
- Takashi Kitagaki
- G01 - MEASURING TESTING
Information Patent Grant
Data processing apparatus for IC tester
- Patent number 6,289,478
- Issue date Sep 11, 2001
- Agilent Technologies, Inc.
- Takashi Kitagaki
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
APPARATUS AND ASSOCIATED METHODS FOR MONITORING NOISE LEVEL OF A SI...
- Publication number 20170146573
- Publication date May 25, 2017
- Keysight Technologies, Inc.
- Takashi Kitagaki
- G01 - MEASURING TESTING