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Takashi Murakami
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Saitama, JP
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last 30 patents
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Patent Grant
Probe for near-field microscope, the method for manufacturing the p...
Patent number
7,241,987
Issue date
Jul 10, 2007
Riken
Yuika Saito
G01 - MEASURING TESTING
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Patent Grant
Device for producing a line of illumination
Patent number
4,460,939
Issue date
Jul 17, 1984
Fuji Photo Optical Co., Ltd.
Takashi Murakami
G02 - OPTICS