Takashi Nakagawa

Person

Kyoto, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Flexible circuit board inspecting apparatus
- Patent number 9,910,084
- Issue date Mar 6, 2018
- Nidec-Read Corporation
- Takashi Nakagawa
- G01 - MEASURING TESTING
Information Patent Grant
Medical measurement device and measurement system
- Patent number 9,877,652
- Issue date Jan 30, 2018
- ARKRAY, Inc.
- Takashi Nakagawa
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Grant
Measuring apparatus
- Patent number 9,451,907
- Issue date Sep 27, 2016
- ARKRAY, Inc.
- Takashi Nakagawa
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Grant
Optical measurement apparatus
- Patent number 9,417,235
- Issue date Aug 16, 2016
- ARKRAY, Inc.
- Takashi Nakagawa
- G01 - MEASURING TESTING
Information Patent Grant
Measurement system, measurement method, program for implementing th...
- Patent number 9,285,380
- Issue date Mar 15, 2016
- ARKRAY, Inc.
- Tokuo Kasai
- G01 - MEASURING TESTING
Information Patent Grant
Test instrument and optical measurement apparatus
- Patent number 8,574,511
- Issue date Nov 5, 2013
- ARKRAY, Inc.
- Takashi Nakagawa
- G01 - MEASURING TESTING
Information Patent Grant
Optical measurement apparatus
- Patent number 8,277,752
- Issue date Oct 2, 2012
- ARKRAY, Inc.
- Takashi Nakagawa
- G01 - MEASURING TESTING
Information Patent Grant
Test instrument and optical measurement apparatus
- Patent number 8,182,761
- Issue date May 22, 2012
- ARKRAY, Inc.
- Takashi Nakagawa
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
CRACK DETECTION METHOD FOR PIEZOELECTRIC ELEMENT AND CRACK DETECTIO...
- Publication number 20250224358
- Publication date Jul 10, 2025
- SUNCALL CORPORATION
- Takashi Nakagawa
- G01 - MEASURING TESTING
Information Patent Application
CRACK DETECTION METHOD FOR PIEZOELECTRIC ELEMENT AND CRACK DETECTIO...
- Publication number 20250224357
- Publication date Jul 10, 2025
- SUNCALL CORPORATION
- Takashi Nakagawa
- G01 - MEASURING TESTING
Information Patent Application
PROCESSING OBJECT TRANSPORT SYSTEM, AND SUBSTRATE INSPECTION SYSTEM
- Publication number 20160163576
- Publication date Jun 9, 2016
- NIDEC-READ CORPORATION
- Takashi Nakagawa
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
FLEXIBLE CIRCUIT BOARD INSPECTING APPARATUS
- Publication number 20150268298
- Publication date Sep 24, 2015
- NIDEC-READ CORPORATION
- Takashi NAKAGAWA
- G01 - MEASURING TESTING
Information Patent Application
CONTACT APPARATUS
- Publication number 20150083449
- Publication date Mar 26, 2015
- NIDEC-READ CORPORATION
- Takashi Nakagawa
- B25 - HAND TOOLS PORTABLE POWER-DRIVEN TOOLS MANIPULATORS
Information Patent Application
PROCESSING OBJECT TRANSPORT SYSTEM, AND SUBSTRATE INSPECTION SYSTEM
- Publication number 20150086303
- Publication date Mar 26, 2015
- NIDEC-READ CORPORATION
- Takashi Nakagawa
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
MEDICAL MEASUREMENT DEVICE AND MEASUREMENT SYSTEM
- Publication number 20140232554
- Publication date Aug 21, 2014
- ARKRAY, INC.
- Takashi NAKAGAWA
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Application
MEASURING APPARATUS
- Publication number 20120330617
- Publication date Dec 27, 2012
- ARKRAY, Inc.
- Takashi NAKAGAWA
- G01 - MEASURING TESTING
Information Patent Application
Measurement System, Measurement Method, Program for Implementing th...
- Publication number 20120288851
- Publication date Nov 15, 2012
- ARKRAY, Inc.
- Tokuo Kasai
- G01 - MEASURING TESTING
Information Patent Application
TEST INSTRUMENT AND OPTICAL MEASUREMENT APPARATUS
- Publication number 20120207653
- Publication date Aug 16, 2012
- ARKRAY, INC.
- Takashi Nakagawa
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
ANALYSIS DEVICE
- Publication number 20120196354
- Publication date Aug 2, 2012
- ARKRAY, Inc.
- Takashi Nakagawa
- G01 - MEASURING TESTING
Information Patent Application
OPTICAL MEASUREMENT APPARATUS
- Publication number 20110058993
- Publication date Mar 10, 2011
- ARKRAY, INC.
- Takashi Nakagawa
- G01 - MEASURING TESTING
Information Patent Application
TEST INSTRUMENT AND OPTICAL MEASUREMENT APPARATUS
- Publication number 20110058994
- Publication date Mar 10, 2011
- ARKRAY, INC.
- Takashi Nakagawa
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
OPTICAL MEASUREMENT APPARATUS
- Publication number 20110058995
- Publication date Mar 10, 2011
- ARKRAY, Inc.
- Takashi Nakagawa
- G01 - MEASURING TESTING

Takashi Nakagawa

Person

Patents Grantslast 30 patents

Flexible circuit board inspecting apparatus

Medical measurement device and measurement system

Measuring apparatus

Optical measurement apparatus

Measurement system, measurement method, program for implementing th...

Test instrument and optical measurement apparatus

Optical measurement apparatus

Test instrument and optical measurement apparatus

Patents Applicationslast 30 patents

CRACK DETECTION METHOD FOR PIEZOELECTRIC ELEMENT AND CRACK DETECTIO...

CRACK DETECTION METHOD FOR PIEZOELECTRIC ELEMENT AND CRACK DETECTIO...

PROCESSING OBJECT TRANSPORT SYSTEM, AND SUBSTRATE INSPECTION SYSTEM

FLEXIBLE CIRCUIT BOARD INSPECTING APPARATUS

CONTACT APPARATUS

PROCESSING OBJECT TRANSPORT SYSTEM, AND SUBSTRATE INSPECTION SYSTEM

MEDICAL MEASUREMENT DEVICE AND MEASUREMENT SYSTEM

MEASURING APPARATUS

Measurement System, Measurement Method, Program for Implementing th...

TEST INSTRUMENT AND OPTICAL MEASUREMENT APPARATUS

ANALYSIS DEVICE

OPTICAL MEASUREMENT APPARATUS

TEST INSTRUMENT AND OPTICAL MEASUREMENT APPARATUS

OPTICAL MEASUREMENT APPARATUS