Takashi Nasuno

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Ibaraki, JP

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Patents Grantslast 30 patents

Information Patent Grant
Structure of test element group wiring and semiconductor substrate
- Patent number 7,176,486
- Issue date Feb 13, 2007
- Rohm Co., Ltd.
- Takashi Nasuno
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method of manufacturing semiconductor device
- Patent number 7,125,794
- Issue date Oct 24, 2006
- Renesas Technology Corp.
- Seiichi Kondo
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
STRUCTURE OF SEMICONDUCTOR SUBSTRATE INCLUDING TEST ELEMENT GROUP W...
- Publication number 20060131578
- Publication date Jun 22, 2006
- ROHM CO., LTD.
- Takashi Nasuno
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Method for forming inorganic porus film
- Publication number 20050181576
- Publication date Aug 18, 2005
- Semiconductor Leading Edge Technologies, Inc.
- Shinichi Ogawa
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Structure of test element group wiring and semiconductor substrate
- Publication number 20050139826
- Publication date Jun 30, 2005
- Semiconductor Leading Edge Technologies, Inc.
- Takashi Nasuno
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Method of manufacturing semiconductor device
- Publication number 20050064699
- Publication date Mar 24, 2005
- Semiconductor Leading Edge Technologies, Inc.
- Seiichi Kondo
- H01 - BASIC ELECTRIC ELEMENTS