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Takashi Noda
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Shimotsuke-shi, JP
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Patents Grants
last 30 patents
Information
Patent Grant
Method for controlling shape measuring apparatus
Patent number
10,859,365
Issue date
Dec 8, 2020
Mitutoyo Corporation
Takashi Noda
G05 - CONTROLLING REGULATING
Information
Patent Grant
Method for controlling shape measuring apparatus
Patent number
10,746,523
Issue date
Aug 18, 2020
Mitutoyo Corporation
Takashi Noda
G01 - MEASURING TESTING
Information
Patent Grant
Control method of shape measuring apparatus
Patent number
10,724,840
Issue date
Jul 28, 2020
Mitutoyo Corporation
Takashi Noda
G01 - MEASURING TESTING
Information
Patent Grant
Method for controlling shape measuring apparatus
Patent number
10,697,748
Issue date
Jun 30, 2020
Mitutoyo Corporation
Takashi Noda
G01 - MEASURING TESTING
Information
Patent Grant
Method for controlling shape measuring apparatus
Patent number
10,379,520
Issue date
Aug 13, 2019
Mitutoyo Corporation
Takashi Noda
G05 - CONTROLLING REGULATING
Information
Patent Grant
Control method of profile measuring apparatus
Patent number
10,365,630
Issue date
Jul 30, 2019
Mitutoyo Corporation
Takashi Noda
G05 - CONTROLLING REGULATING
Information
Patent Grant
Method for controlling shape measuring apparatus
Patent number
10,274,297
Issue date
Apr 30, 2019
Mitutoyo Corporation
Takashi Noda
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Control method of profile measuring apparatus
Patent number
9,964,392
Issue date
May 8, 2018
Mitutoyo Corporation
Takashi Noda
G01 - MEASURING TESTING
Information
Patent Grant
Method for controlling shape measuring apparatus
Patent number
9,915,516
Issue date
Mar 13, 2018
Mitutoyo Corporation
Takashi Noda
G05 - CONTROLLING REGULATING
Information
Patent Grant
Shape measuring apparatus and control method of shape measuring app...
Patent number
9,448,052
Issue date
Sep 20, 2016
Mitutoyo Corporation
Takashi Noda
G05 - CONTROLLING REGULATING
Information
Patent Grant
Form measuring apparatus and form measurement method
Patent number
9,366,522
Issue date
Jun 14, 2016
Mitutoyo Corporation
Takashi Noda
G01 - MEASURING TESTING
Information
Patent Grant
Form measuring apparatus and measuring method for V groove center
Patent number
9,341,459
Issue date
May 17, 2016
Mitutoyo Corporation
Takashi Noda
G01 - MEASURING TESTING
Information
Patent Grant
Form measuring apparatus and method of registering coordinate syste...
Patent number
9,335,143
Issue date
May 10, 2016
Mitutoyo Corporation
Takashi Noda
G01 - MEASURING TESTING
Information
Patent Grant
Shape measuring apparatus
Patent number
9,298,178
Issue date
Mar 29, 2016
Mitutoyo Corporation
Takashi Noda
G05 - CONTROLLING REGULATING
Information
Patent Grant
Corrected ball diameter calculating method and form measuring instr...
Patent number
9,151,602
Issue date
Oct 6, 2015
Mitutoyo Corporation
Takashi Noda
G01 - MEASURING TESTING
Information
Patent Grant
Profile measuring method and profile measuring instrument
Patent number
9,103,648
Issue date
Aug 11, 2015
Mitutoyo Corporation
Takashi Noda
G05 - CONTROLLING REGULATING
Information
Patent Grant
Shape measuring apparatus
Patent number
8,478,564
Issue date
Jul 2, 2013
Mitutoyo Corporation
Takashi Noda
G01 - MEASURING TESTING
Information
Patent Grant
Profile measurement apparatus
Patent number
8,407,908
Issue date
Apr 2, 2013
Mitutoyo Corporation
Takashi Noda
G01 - MEASURING TESTING
Information
Patent Grant
Scanning measurement instrument
Patent number
7,958,564
Issue date
Jun 7, 2011
Mitutoyo Corporation
Takashi Noda
G01 - MEASURING TESTING
Information
Patent Grant
Apparatus, method and program for measuring surface texture
Patent number
7,643,963
Issue date
Jan 5, 2010
Mitutoyo Corporation
Takashi Noda
G01 - MEASURING TESTING
Information
Patent Grant
Surface scan measuring device, surface scan measuring method, surfa...
Patent number
7,392,692
Issue date
Jul 1, 2008
Mitutoyo Corporation
Takashi Noda
G01 - MEASURING TESTING
Information
Patent Grant
Surface scan measuring device and method of forming compensation ta...
Patent number
7,376,261
Issue date
May 20, 2008
Mitutoyo Corporation
Takashi Noda
G01 - MEASURING TESTING
Information
Patent Grant
Surface scan measuring instrument, surface scan measuring method, s...
Patent number
7,039,550
Issue date
May 2, 2006
Mitutoyo Corporation
Takashi Noda
G01 - MEASURING TESTING
Information
Patent Grant
Method for calibrating probe and computer-readable medium
Patent number
6,701,267
Issue date
Mar 2, 2004
Mitutoyo Corporation
Takashi Noda
G01 - MEASURING TESTING
Information
Patent Grant
Method for calibrating scanning probe and computer-readable medium...
Patent number
6,701,268
Issue date
Mar 2, 2004
Mitutoyo Corporation
Takashi Noda
G01 - MEASURING TESTING
Information
Patent Grant
V-groove shape measuring method and apparatus by using rotary table
Patent number
6,460,261
Issue date
Oct 8, 2002
Mitutoyo Corporation
Takashi Noda
G05 - CONTROLLING REGULATING
Information
Patent Grant
Probe coordinate system driving apparatus
Patent number
6,108,613
Issue date
Aug 22, 2000
Mitutoyo Corporation
Tetsuo Kimura
G05 - CONTROLLING REGULATING
Information
Patent Grant
Measuring method and measuring instrument
Patent number
6,044,569
Issue date
Apr 4, 2000
Mitutoyo Corporation
Motonori Ogihara
G05 - CONTROLLING REGULATING
Patents Applications
last 30 patents
Information
Patent Application
METHOD FOR CONTROLLING SHAPE MEASURING APPARATUS
Publication number
20190078866
Publication date
Mar 14, 2019
Mitutoyo Corporation
Takashi Noda
G01 - MEASURING TESTING
Information
Patent Application
METHOD FOR CONTROLLING SHAPE MEASURING APPARATUS
Publication number
20190078867
Publication date
Mar 14, 2019
Mitutoyo Corporation
Takashi Noda
G01 - MEASURING TESTING
Information
Patent Application
METHOD FOR CONTROLLING SHAPE MEASURING APPARATUS
Publication number
20190078865
Publication date
Mar 14, 2019
Mitutoyo Corporation
Takashi Noda
G01 - MEASURING TESTING
Information
Patent Application
METHOD FOR CONTROLLING SHAPE MEASURING APPARATUS
Publication number
20180216924
Publication date
Aug 2, 2018
MITUTOYO CORPORATION
Takashi NODA
G01 - MEASURING TESTING
Information
Patent Application
CONTROL METHOD OF SHAPE MEASURING APPARATUS
Publication number
20180149458
Publication date
May 31, 2018
MITUTOYO CORPORATION
Takashi NODA
G01 - MEASURING TESTING
Information
Patent Application
CONTROL METHOD OF PROFILE MEASURING APPARATUS
Publication number
20180017954
Publication date
Jan 18, 2018
MITUTOYO CORPORATION
Takashi NODA
G01 - MEASURING TESTING
Information
Patent Application
CONTROL METHOD OF PROFILE MEASURING APPARATUS
Publication number
20170115109
Publication date
Apr 27, 2017
MITUTOYO CORPORATION
Takashi NODA
G01 - MEASURING TESTING
Information
Patent Application
METHOD FOR CONTROLLING SHAPE MEASURING APPARATUS
Publication number
20170090455
Publication date
Mar 30, 2017
Mitutoyo Corporation
Takashi Noda
G01 - MEASURING TESTING
Information
Patent Application
METHOD FOR CONTROLLING SHAPE MEASURING APPARATUS
Publication number
20160356591
Publication date
Dec 8, 2016
MITUTOYO CORPORATION
Takashi NODA
G01 - MEASURING TESTING
Information
Patent Application
METHOD FOR CONTROLLING SHAPE MEASURING APPARATUS
Publication number
20160341533
Publication date
Nov 24, 2016
MITUTOYO CORPORATION
Takashi NODA
G01 - MEASURING TESTING
Information
Patent Application
FORM MEASURING APPARATUS AND FORM MEASUREMENT METHOD
Publication number
20150143708
Publication date
May 28, 2015
MITUTOYO CORPORATION
Takashi NODA
G01 - MEASURING TESTING
Information
Patent Application
FORM MEASURING APPARATUS AND METHOD OF REGISTERING COORDINATE SYSTE...
Publication number
20150052770
Publication date
Feb 26, 2015
MITUTOYO CORPORATION
Takashi NODA
G01 - MEASURING TESTING
Information
Patent Application
FORM MEASURING APPARATUS AND MEASURING METHOD FOR V GROOVE CENTER
Publication number
20150052769
Publication date
Feb 26, 2015
MITUTOYO CORPORATION
Takashi NODA
G01 - MEASURING TESTING
Information
Patent Application
SHAPE MEASURING APPARATUS AND CONTROL METHOD OF SHAPE MEASURING APP...
Publication number
20140025336
Publication date
Jan 23, 2014
Takashi NODA
G01 - MEASURING TESTING
Information
Patent Application
SHAPE MEASURING APPARATUS
Publication number
20130310962
Publication date
Nov 21, 2013
MITUTOYO CORPORATION
Takashi NODA
G01 - MEASURING TESTING
Information
Patent Application
PROFILE MEASURING METHOD AND PROFILE MEASURING INSTRUMENT
Publication number
20130283627
Publication date
Oct 31, 2013
Mitutoyo Corporation
Takashi Noda
G01 - MEASURING TESTING
Information
Patent Application
PROFILE MEASUREMENT APPARATUS
Publication number
20110314686
Publication date
Dec 29, 2011
Mitutoyo Corporation
Takashi Noda
G01 - MEASURING TESTING
Information
Patent Application
SHAPE MEASURING APPARATUS
Publication number
20110066400
Publication date
Mar 17, 2011
MITUTOYO CORPORATION
Takashi NODA
G01 - MEASURING TESTING
Information
Patent Application
CORRECTED BALL DIAMETER CALCULATING METHOD AND FORM MEASURING INSTR...
Publication number
20100250178
Publication date
Sep 30, 2010
Mitutoyo Corporation
Takashi Noda
G01 - MEASURING TESTING
Information
Patent Application
SCANNING MEASUREMENT INSTRUMENT
Publication number
20090217426
Publication date
Aug 27, 2009
Mitutoyo Corporation
Takashi Noda
G01 - MEASURING TESTING
Information
Patent Application
APPARATUS, METHOD AND PROGRAM FOR MEASURING SURFACE TEXTURE
Publication number
20080236260
Publication date
Oct 2, 2008
Mitutoyo Corporation
Takashi Noda
G01 - MEASURING TESTING
Information
Patent Application
Surface scan measuring device, surface scan measuring method, surfa...
Publication number
20050263727
Publication date
Dec 1, 2005
Mitutoyo Corporation
Takashi Noda
G05 - CONTROLLING REGULATING
Information
Patent Application
Surface scan measuring device and method of forming compensation ta...
Publication number
20050111725
Publication date
May 26, 2005
Mitutoyo Corporation
Takashi Noda
G01 - MEASURING TESTING
Information
Patent Application
Surface scan measuring instrument, surface scan measuring method, s...
Publication number
20040260509
Publication date
Dec 23, 2004
Mitutoyo Corporation
Takashi Noda
G01 - MEASURING TESTING
Information
Patent Application
Method for calibrating probe and computer-readable medium
Publication number
20030069708
Publication date
Apr 10, 2003
Mitutoyo Corporation
Takashi Noda
G01 - MEASURING TESTING
Information
Patent Application
Method for calibrating scanning probe and computer-readable medium...
Publication number
20030069709
Publication date
Apr 10, 2003
Mitutoyo Corporation
Takashi Noda
G01 - MEASURING TESTING