Takashi Nozaki

Person

  • Moriya-shi, JP

Patents Grantslast 30 patents

  • Information Patent Grant

    Charged particle measuring apparatus

    • Patent number 6,710,352
    • Issue date Mar 23, 2004
    • National Space Development Agency of Japan
    • Jun Kikuchi
    • G01 - MEASURING TESTING

Patents Applicationslast 30 patents