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Takashi Nozaki
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Moriya-shi, JP
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Patents Grants
last 30 patents
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Patent Grant
Charged particle measuring apparatus
Patent number
6,710,352
Issue date
Mar 23, 2004
National Space Development Agency of Japan
Jun Kikuchi
G01 - MEASURING TESTING
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last 30 patents
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Patent Application
Charged particle measuring apparatus
Publication number
20030158678
Publication date
Aug 21, 2003
Jun Kikuchi
G01 - MEASURING TESTING