Takashi OGASAWARA

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Tokyo, JP

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Patents Grantslast 30 patents

Information Patent Grant
Probe block, probe card and probe apparatus both having the probe b...
- Patent number 9,207,260
- Issue date Dec 8, 2015
- Kabushiki Kaisha Nihon Micronics
- Takashi Ogasawara
- G01 - MEASURING TESTING
Information Patent Grant
Electrostatic recording material
- Patent number 5,182,159
- Issue date Jan 26, 1993
- Oji Paper Co., Ltd.
- Hiroshige Yamauchi
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY

Patents Applicationslast 30 patents

Information Patent Application
PROBE BLOCK, PROBE CARD AND PROBE APPARATUS BOTH HAVING THE PROBE B...
- Publication number 20130113512
- Publication date May 9, 2013
- Kabushiki Kaisha Nihon Micronics
- Takashi OGASAWARA
- G01 - MEASURING TESTING