Takashi OGAWA

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Daejeon, KR

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Patents Grantslast 30 patents

Information Patent Grant
Monochromator and charged particle beam apparatus comprising the same
- Patent number 10,622,183
- Issue date Apr 14, 2020
- Korea Research Institute of Standards and Science
- Takashi Ogawa
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Electron beam apparatus comprising monochromator
- Patent number 10,614,991
- Issue date Apr 7, 2020
- Korea Research Institute of Standards and Science
- Takashi Ogawa
- G01 - MEASURING TESTING
Information Patent Grant
Monochromator and charged particle apparatus including the same
- Patent number 9,425,022
- Issue date Aug 23, 2016
- Korea Research Institute of Standards and Science
- Takashi Ogawa
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
ELECTRON BEAM APPARATUS COMPRISING MONOCHROMATOR
- Publication number 20190154502
- Publication date May 23, 2019
- Korea Research Institute of Standards and Science
- Takashi OGAWA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
MONOCHROMATOR AND CHARGED PARTICLE BEAM APPARATUS COMPRISING THE SAME
- Publication number 20180114672
- Publication date Apr 26, 2018
- Korea Research Institute of Standards and Science
- Takashi OGAWA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
MONOCHROMATOR AND CHARGED PARTICLE APPARATUS INCLUDING THE SAME
- Publication number 20150371811
- Publication date Dec 24, 2015
- Korea Research Institute of Standards and Science
- Takashi OGAWA
- G01 - MEASURING TESTING