Takashi Ohshima

Person

Akishima, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Electron gun and electron beam application apparatus
- Patent number 12,165,828
- Issue date Dec 10, 2024
- HITACHI HIGH-TECH CORPORATION
- Takashi Ohshima
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Electron beam apparatus
- Patent number 11,784,022
- Issue date Oct 10, 2023
- HITACHI HIGH-TECH CORPORATION
- Takashi Ohshima
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Electron source, method for manufacturing the same, and electron be...
- Patent number 11,322,329
- Issue date May 3, 2022
- HITACHI HIGH-TECH CORPORATION
- Toshiaki Kusunoki
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Electron microscope
- Patent number 11,251,011
- Issue date Feb 15, 2022
- HITACHI HIGH-TECH CORPORATION
- Takashi Ohshima
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Electron microscope
- Patent number 11,087,947
- Issue date Aug 10, 2021
- HITACHI HIGH-TECH CORPORATION
- Takashi Ohshima
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Charged particle detector including a light-emitting section having...
- Patent number 11,062,892
- Issue date Jul 13, 2021
- HITACHI HIGH-TECH CORPORATION
- Shin Imamura
- G01 - MEASURING TESTING
Information Patent Grant
Charged particle detector and charged particle beam apparatus
- Patent number 10,984,979
- Issue date Apr 20, 2021
- HITACHI HIGH-TECH CORPORATION
- Shin Imamura
- G01 - MEASURING TESTING
Information Patent Grant
Electron source and electron beam device using the same
- Patent number 10,707,046
- Issue date Jul 7, 2020
- HITACHI HIGH-TECH CORPORATION
- Toshiaki Kusunoki
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Field emission electron source, method for manufacturing same, and...
- Patent number 10,586,674
- Issue date Mar 10, 2020
- Hitachi High-Technologies Corporation
- Toshiaki Kusunoki
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Electron beam apparatus
- Patent number 10,522,319
- Issue date Dec 31, 2019
- Hitachi High-Technologies Corporation
- Keigo Kasuya
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Ion beam device and sample observation method
- Patent number 10,340,117
- Issue date Jul 2, 2019
- Hitachi, Ltd.
- Shinichi Matsubara
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Charged particle beam device, sample observation method, sample pla...
- Patent number 10,241,062
- Issue date Mar 26, 2019
- Hitachi High-Technologies Corporation
- Yusuke Ominami
- G01 - MEASURING TESTING
Information Patent Grant
Charged particle beam device
- Patent number 10,134,564
- Issue date Nov 20, 2018
- Hitachi High-Technologies Corporation
- Taiga Okumura
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Ion pump and charged particle beam device using the same
- Patent number 9,837,243
- Issue date Dec 5, 2017
- Hitachi, Ltd.
- Keigo Kasuya
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Sample holder with light emitting and transferring elements for a c...
- Patent number 9,812,288
- Issue date Nov 7, 2017
- Hitachi High-Technologies Corporation
- Minami Shouji
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Floor panel
- Patent number 9,771,724
- Issue date Sep 26, 2017
- SENQCIA CORPORATION
- Takashi Ohshima
- E04 - BUILDING
Information Patent Grant
Base isolation floor structure
- Patent number 9,752,330
- Issue date Sep 5, 2017
- SENQCIA CORPORATION
- Takashi Ohshima
- E04 - BUILDING
Information Patent Grant
Floor panel
- Patent number 9,683,374
- Issue date Jun 20, 2017
- SENQCIA CORPORATION
- Takashi Ohshima
- E04 - BUILDING
Information Patent Grant
Lid member and floor panel using the same
- Patent number 9,593,492
- Issue date Mar 14, 2017
- SENQCIA CORPORATION
- Takashi Ohshima
- E04 - BUILDING
Information Patent Grant
Electron gun, charged particle gun, and charged particle beam appar...
- Patent number 9,570,268
- Issue date Feb 14, 2017
- Hitachi High-Technologies Corporation
- Yuta Imai
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Sample base, charged particle beam device and sample observation me...
- Patent number 9,508,527
- Issue date Nov 29, 2016
- Hitachi High-Technologies Corporation
- Yusuke Ominami
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Electron microscope and electron beam detector
- Patent number 9,355,815
- Issue date May 31, 2016
- Hitachi High-Technologies Corporation
- Shin Imamura
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Free access floor panel
- Patent number D754368
- Issue date Apr 19, 2016
- SENQCIA CO., LTD.
- Takashi Ohshima
- D25 - Building units and construction elements
Information Patent Grant
Free access floor panel
- Patent number D754369
- Issue date Apr 19, 2016
- SENQCIA CO., LTD.
- Takashi Ohshima
- D25 - Building units and construction elements
Information Patent Grant
Lid for opening portion of free access floor panel
- Patent number D745193
- Issue date Dec 8, 2015
- HITACHI METALS TECHNO, LTD.
- Takashi Ohshima
- D25 - Building units and construction elements
Information Patent Grant
Electron beam apparatus for visualizing a displacement of an electr...
- Patent number 9,208,994
- Issue date Dec 8, 2015
- Hitachi High-Technologies Corporation
- Takashi Ohshima
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Charged particle beam apparatus
- Patent number 9,208,995
- Issue date Dec 8, 2015
- Hitachi High-Technologies Corporation
- Yusuke Ominami
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Charged particle radiation device with bandpass detection
- Patent number 9,202,667
- Issue date Dec 1, 2015
- Hitachi High-Technologies Corporation
- Michio Hatano
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Scanning electron microscope
- Patent number 9,029,766
- Issue date May 12, 2015
- Hitachi High-Technologies Corporation
- Hideo Morishita
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Electric field discharge-type electron source
- Patent number 8,866,371
- Issue date Oct 21, 2014
- Hitachi High-Technologies Corporation
- Souichi Katagiri
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
ELECTRON BEAM APPLICATION DEVICE
- Publication number 20240161997
- Publication date May 16, 2024
- HITACHI HIGH-TECH CORPORATION
- Takashi OHSHIMA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ELECTRON GUN AND ELECTRON BEAM APPLICATION APPARATUS
- Publication number 20240120168
- Publication date Apr 11, 2024
- Hitachi High-Tech Corporation
- Takashi Ohshima
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ELECTRON GUN AND ELECTRON BEAM APPLICATION DEVICE
- Publication number 20230402246
- Publication date Dec 14, 2023
- HITACHI HIGH-TECH CORPORATION
- Hideo MORISHITA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ELECTRON BEAM APPLICATION DEVICE
- Publication number 20230335367
- Publication date Oct 19, 2023
- HITACHI HIGH-TECH CORPORATION
- Takashi OHSHIMA
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Application
ELECTRON GUN AND ELECTRON MICROSCOPE
- Publication number 20220406558
- Publication date Dec 22, 2022
- HITACHI HIGH-TECH CORPORATION
- Hideo MORISHITA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ELECTRON BEAM APPARATUS
- Publication number 20220165536
- Publication date May 26, 2022
- Hitachi High-Tech Corporation
- Takashi Ohshima
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ELECTRON SOURCE, METHOD FOR MANUFACTURING THE SAME, AND ELECTRON BE...
- Publication number 20210327674
- Publication date Oct 21, 2021
- HITACHI HIGH-TECH CORPORATION
- Toshiaki KUSUNOKI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ELECTRON BEAM APPLICATION DEVICE
- Publication number 20210319970
- Publication date Oct 14, 2021
- Hitachi High-Tech Corporation
- Takashi Ohshima
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ELECTRON MICROSCOPE
- Publication number 20200303152
- Publication date Sep 24, 2020
- Hitachi High-Technologies Corporation
- Takashi OHSHIMA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Electron Source and Electron Beam Device Using the Same
- Publication number 20190385809
- Publication date Dec 19, 2019
- Hitachi High-Technologies Corporation
- Toshiaki KUSUNOKI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CHARGED PARTICLE DETECTOR AND CHARGED PARTICLE BEAM APPARATUS
- Publication number 20190355549
- Publication date Nov 21, 2019
- Hitachi High-Technologies Corporation
- Shin IMAMURA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Electron Beam Apparatus
- Publication number 20190237289
- Publication date Aug 1, 2019
- Hitachi High-Technologies Corporation
- Keigo KASUYA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Field Emission Electron Source, Method for Manufacturing Same, and...
- Publication number 20190066966
- Publication date Feb 28, 2019
- Hitachi High-Technologies Corporation
- Toshiaki KUSUNOKI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CHARGED PARTICLE DETECTOR, CHARGED PARTICLE BEAM DEVICE, AND MASS S...
- Publication number 20190027351
- Publication date Jan 24, 2019
- Hitachi High-Technologies Corporation
- Shin IMAMURA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CHARGED PARTICLE BEAM DEVICE
- Publication number 20170330724
- Publication date Nov 16, 2017
- Hitachi High-Technologies Corporation
- Taiga OKUMURA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ION BEAM DEVICE AND SAMPLE OBSERVATION METHOD
- Publication number 20170229284
- Publication date Aug 10, 2017
- Hitachi, Ltd
- Shinichi MATSUBARA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SAMPLE HOLDER, OBSERVATION SYSTEM, AND IMAGE GENERATION METHOD
- Publication number 20170069458
- Publication date Mar 9, 2017
- Hitachi High-Technologies Corporation
- Minami SHOUJI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
FLOOR PANEL
- Publication number 20160237698
- Publication date Aug 18, 2016
- Hitachi Metals Techno, Ltd.
- Takashi OHSHIMA
- E04 - BUILDING
Information Patent Application
ION PUMP AND CHARGED PARTICLE BEAM DEVICE USING THE SAME
- Publication number 20160233050
- Publication date Aug 11, 2016
- Hitachi, Ltd
- Keigo KASUYA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
FLOOR PANEL
- Publication number 20160201340
- Publication date Jul 14, 2016
- Hitachi Metals Techno, Ltd.
- Takashi OHSHIMA
- E04 - BUILDING
Information Patent Application
LID MEMBER AND FLOOR PANEL USING THE SAME
- Publication number 20160153201
- Publication date Jun 2, 2016
- Hitachi Metals Techno, Ltd.
- Takashi OHSHIMA
- E04 - BUILDING
Information Patent Application
ELECTRON GUN, CHARGED PARTICLE GUN, AND CHARGED PARTICLE BEAM APPAR...
- Publication number 20160104597
- Publication date Apr 14, 2016
- Hitachi High-Technologies Corporation
- Yuta IMAI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
BASE ISOLATION FLOOR STRUCTURE
- Publication number 20160097205
- Publication date Apr 7, 2016
- Hitachi Metals Techno, Ltd.
- Takashi OHSHIMA
- E04 - BUILDING
Information Patent Application
Charged Particle Beam Device, Sample Observation Method, Sample Pla...
- Publication number 20160025659
- Publication date Jan 28, 2016
- Hitachi High-Technologies Corporation
- Yusuke OMINAMI
- G01 - MEASURING TESTING
Information Patent Application
Sample Base, Charged Particle Beam Device and Sample Observation Me...
- Publication number 20150318143
- Publication date Nov 5, 2015
- Hitachi High-Technologies Corporation
- Yusuke OMINAMI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ELECTRON MICROSCOPE AND ELECTRON BEAM DETECTOR
- Publication number 20150214002
- Publication date Jul 30, 2015
- Hitachi High-Technologies Corporation
- Shin Imamura
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CHARGED PARTICLE BEAM APPARATUS
- Publication number 20150014530
- Publication date Jan 15, 2015
- Hitachi High-Technologies Corporation
- Yusuke Ominami
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SCANNING ELECTRON MICROSCOPE
- Publication number 20140361167
- Publication date Dec 11, 2014
- Hitachi High-Technologies Corporation
- Hideo Morishita
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ELECTRIC FIELD DISCHARGE-TYPE ELECTRON SOURCE
- Publication number 20140197725
- Publication date Jul 17, 2014
- Souichi Katagiri
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Electron Beam Apparatus
- Publication number 20130146766
- Publication date Jun 13, 2013
- Hitachi High-Technologies Corporation
- Takashi Ohshima
- H01 - BASIC ELECTRIC ELEMENTS

Takashi Ohshima

Person

Patents Grantslast 30 patents

Electron gun and electron beam application apparatus

Electron beam apparatus

Electron source, method for manufacturing the same, and electron be...

Electron microscope

Electron microscope

Charged particle detector including a light-emitting section having...

Charged particle detector and charged particle beam apparatus

Electron source and electron beam device using the same

Field emission electron source, method for manufacturing same, and...

Electron beam apparatus

Ion beam device and sample observation method

Charged particle beam device, sample observation method, sample pla...

Charged particle beam device

Ion pump and charged particle beam device using the same

Sample holder with light emitting and transferring elements for a c...

Floor panel

Base isolation floor structure

Floor panel

Lid member and floor panel using the same

Electron gun, charged particle gun, and charged particle beam appar...

Sample base, charged particle beam device and sample observation me...

Electron microscope and electron beam detector

Free access floor panel

Free access floor panel

Lid for opening portion of free access floor panel

Electron beam apparatus for visualizing a displacement of an electr...

Charged particle beam apparatus

Charged particle radiation device with bandpass detection

Scanning electron microscope

Electric field discharge-type electron source

Patents Applicationslast 30 patents

ELECTRON BEAM APPLICATION DEVICE

ELECTRON GUN AND ELECTRON BEAM APPLICATION APPARATUS

ELECTRON GUN AND ELECTRON BEAM APPLICATION DEVICE

ELECTRON BEAM APPLICATION DEVICE

ELECTRON GUN AND ELECTRON MICROSCOPE

ELECTRON BEAM APPARATUS

ELECTRON SOURCE, METHOD FOR MANUFACTURING THE SAME, AND ELECTRON BE...

ELECTRON BEAM APPLICATION DEVICE

ELECTRON MICROSCOPE

Electron Source and Electron Beam Device Using the Same

CHARGED PARTICLE DETECTOR AND CHARGED PARTICLE BEAM APPARATUS

Electron Beam Apparatus

Field Emission Electron Source, Method for Manufacturing Same, and...

CHARGED PARTICLE DETECTOR, CHARGED PARTICLE BEAM DEVICE, AND MASS S...

CHARGED PARTICLE BEAM DEVICE

ION BEAM DEVICE AND SAMPLE OBSERVATION METHOD

SAMPLE HOLDER, OBSERVATION SYSTEM, AND IMAGE GENERATION METHOD

FLOOR PANEL

ION PUMP AND CHARGED PARTICLE BEAM DEVICE USING THE SAME

FLOOR PANEL

LID MEMBER AND FLOOR PANEL USING THE SAME

ELECTRON GUN, CHARGED PARTICLE GUN, AND CHARGED PARTICLE BEAM APPAR...

BASE ISOLATION FLOOR STRUCTURE

Charged Particle Beam Device, Sample Observation Method, Sample Pla...

Sample Base, Charged Particle Beam Device and Sample Observation Me...

ELECTRON MICROSCOPE AND ELECTRON BEAM DETECTOR

CHARGED PARTICLE BEAM APPARATUS

SCANNING ELECTRON MICROSCOPE

ELECTRIC FIELD DISCHARGE-TYPE ELECTRON SOURCE

Electron Beam Apparatus