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Takashi Okamuro

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  • Chiyoda-ku, JP
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Patents Grantslast 30 patents

  • Information Patent Grant

    Magnetic rotation-angle detector
    • Patent number 9,702,735
    • Issue date Jul 11, 2017
    • Mitsubishi Electric Corporation
    • Takeshi Musha
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Rotation number detector
    • Patent number 9,664,535
    • Issue date May 30, 2017
    • Mitsubishi Electric Corporation
    • Yoshinao Tatei
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Rotation number detector
    • Patent number 9,631,953
    • Issue date Apr 25, 2017
    • Mitsubishi Electric Corporation
    • Yoshinao Tatei
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Rotation-angle detection device
    • Patent number 9,234,738
    • Issue date Jan 12, 2016
    • Mitsubishi Electric Corporation
    • Takumi Asano
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Encoder
    • Patent number 9,157,770
    • Issue date Oct 13, 2015
    • Mitsubishi Electric Corporation
    • Yoichi Omura
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Rotary encoder
    • Patent number 9,155,227
    • Issue date Oct 6, 2015
    • Mitsubishi Electric Corporation
    • Hiroshi Nagata
    • H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
  • Information Patent Grant

    Position detection error correcting method
    • Patent number 8,091,003
    • Issue date Jan 3, 2012
    • Mitsubishi Electric Corporation
    • Hiroshi Sugie
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Electronic device housing
    • Patent number 7,939,796
    • Issue date May 10, 2011
    • Mitsubishi Electric Corporation
    • Toshikazu Satone
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Rotary encoder
    • Patent number 7,046,176
    • Issue date May 16, 2006
    • Mitsubishi Denki Kabushiki Kaisha
    • Takashi Okamuro
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Photoelectric rotary encoder
    • Patent number 6,972,402
    • Issue date Dec 6, 2005
    • Mitsubishi Denki Kabushiki Kaisha
    • Yoichi Ohmura
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Phase-shift photoelectric encoder
    • Patent number 6,956,200
    • Issue date Oct 18, 2005
    • Mitsubishi Denki Kabushiki Kaisha
    • Yoichi Ohmura
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Interference-type distance measuring device
    • Patent number 6,351,312
    • Issue date Feb 26, 2002
    • Mitsubishi Denki Kabushiki Kaisha
    • Hirokazu Sakuma
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Position detection apparatus
    • Patent number 6,348,695
    • Issue date Feb 19, 2002
    • Mitsubishi Denki Kabushiki Kaisha
    • Takashi Okamuro
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Absolute-value encoder device
    • Patent number 6,323,786
    • Issue date Nov 27, 2001
    • Mitsubishi Denki Kabushiki Kaisha
    • Hirokazu Sakuma
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Position detecting apparatus
    • Patent number 6,232,595
    • Issue date May 15, 2001
    • Mitsubishi Denki Kabushiki Kaisha
    • Takashi Okamuro
    • G01 - MEASURING TESTING

Patents Applicationslast 30 patents

  • Information Patent Application

    ROTATION NUMBER DETECTOR
    • Publication number 20150338245
    • Publication date Nov 26, 2015
    • Mitsubishi Electric Corporation
    • Yoshinao TATEI
    • G01 - MEASURING TESTING
  • Information Patent Application

    MAGNETIC ROTATION-ANGLE DETECTOR
    • Publication number 20150054499
    • Publication date Feb 26, 2015
    • MITSUBISHI ELECTRIC CORPORATION
    • Takeshi Musha
    • G01 - MEASURING TESTING
  • Information Patent Application

    ENCODER
    • Publication number 20140091213
    • Publication date Apr 3, 2014
    • MITSUBISHI ELECTRIC CORPORATION
    • Yoichi Omura
    • G01 - MEASURING TESTING
  • Information Patent Application

    ROTARY ENCODER
    • Publication number 20130294031
    • Publication date Nov 7, 2013
    • MITSUBISHI ELECTRIC CORPORATION
    • Hiroshi Nagata
    • G01 - MEASURING TESTING
  • Information Patent Application

    ROTATION-ANGLE DETECTION DEVICE
    • Publication number 20130200885
    • Publication date Aug 8, 2013
    • MITSUBISHI ELECTRIC CORPORATION
    • Takumi Asano
    • G01 - MEASURING TESTING
  • Information Patent Application

    SEMICONDUCTOR PACKAGE AND IMPLEMENTATION STRUCTURE OF SEMICONDUCTOR...
    • Publication number 20120091572
    • Publication date Apr 19, 2012
    • Mitsubishi Electric Corporation
    • Tsuneo Hamaguchi
    • Y02 - TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMA...
  • Information Patent Application

    ELECTRONIC DEVICE HOUSING
    • Publication number 20100148044
    • Publication date Jun 17, 2010
    • Mitsubishi Electric Corporation
    • Toshikazu Satone
    • G01 - MEASURING TESTING
  • Information Patent Application

    POSITION DETECTION ERROR CORRECTING METHOD
    • Publication number 20090259918
    • Publication date Oct 15, 2009
    • MITSUBISHI ELECTRIC CORPORATION
    • Hiroshi Sugie
    • G01 - MEASURING TESTING
  • Information Patent Application

    ROTARY ENCODER
    • Publication number 20060033643
    • Publication date Feb 16, 2006
    • Takashi Okamuro
    • H03 - BASIC ELECTRONIC CIRCUITRY
  • Information Patent Application

    Photoelectric encoder
    • Publication number 20040183000
    • Publication date Sep 23, 2004
    • Mitsubishi Denki Kabushiki Kaisha
    • Yoichi Ohmura
    • H03 - BASIC ELECTRONIC CIRCUITRY
  • Information Patent Application

    Photoelectric rotary encoder
    • Publication number 20040004181
    • Publication date Jan 8, 2004
    • Mitsubishi Denki Kabushiki Kaisha
    • Yoichi Ohmura
    • G01 - MEASURING TESTING
  • Information Patent Application

    Position detection apparatus
    • Publication number 20010001540
    • Publication date May 24, 2001
    • Takashi Okamuro
    • G01 - MEASURING TESTING