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Takashi OMORI
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Kyoto-shi, JP
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Patents Grants
last 30 patents
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Patent Grant
X-ray spectroscopic analysis apparatus and elemental analysis method
Patent number
11,796,491
Issue date
Oct 24, 2023
Shimadzu Corporation
Shinji Miyauchi
G01 - MEASURING TESTING
Patents Applications
last 30 patents
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Patent Application
X-Ray Spectroscopic Analysis Apparatus and Elemental Analysis Method
Publication number
20220214291
Publication date
Jul 7, 2022
Shimadzu Corporation
Shinji MIYAUCHI
G01 - MEASURING TESTING
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Patent Application
Imaging Apparatus and Imaging Method
Publication number
20220114769
Publication date
Apr 14, 2022
Shimadzu Corporation
Takashi OMORI
G06 - COMPUTING CALCULATING COUNTING