Takashi Sato

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Nirasaki, JP

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Patents Grantslast 30 patents

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Testing apparatus for test piece, testing method, contactor and met...
- Patent number 6,573,743
- Issue date Jun 3, 2003
- Tokyo Electron Limited
- Takashi Sato
- G01 - MEASURING TESTING
Information Patent Grant
Testing apparatus for test piece testing method contactor and metho...
- Patent number 6,380,755
- Issue date Apr 30, 2002
- Tokyo Electron Limited
- Takashi Sato
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus and method for testing semiconductor devices formed on a...
- Patent number 6,124,725
- Issue date Sep 26, 2000
- Tokyo Electron Limited
- Takashi Sato
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for inspecting semiconductor integrated circui...
- Patent number 6,084,419
- Issue date Jul 4, 2000
- Tokyo Electron Limited
- Takashi Sato
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus for aligning a semiconductor wafer with an inspection con...
- Patent number 5,999,268
- Issue date Dec 7, 1999
- Tokyo Electron Limited
- Toshihiro Yonezawa
- G01 - MEASURING TESTING
Information Patent Grant
Membrane probing of circuits
- Patent number 5,847,571
- Issue date Dec 8, 1998
- MicroModule Systems
- Ken Kuang-Fu Liu
- G01 - MEASURING TESTING