Takashi Sekino

Person

Tokyo, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Driver circuit
- Patent number 8,115,520
- Issue date Feb 14, 2012
- Advantest Corp.
- Naoki Matsumoto
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Driver circuit for producing signal simulating transmission loss
- Patent number 7,990,177
- Issue date Aug 2, 2011
- Advantest Corp.
- Naoki Matsumoto
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Driver circuit and test apparatus
- Patent number 7,962,110
- Issue date Jun 14, 2011
- Advantest Corporation
- Kensuke Kamo
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Transmission line driving circuit
- Patent number 7,902,835
- Issue date Mar 8, 2011
- Advantest Corporation
- Takayuki Nakamura
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Test apparatus, pin electronics card, electrical device and switch
- Patent number 7,876,120
- Issue date Jan 25, 2011
- Advantest Corporation
- Toshiaki Awaji
- G01 - MEASURING TESTING
Information Patent Grant
Jitter generating circuit
- Patent number 7,808,291
- Issue date Oct 5, 2010
- Advantest Corporation
- Takayuki Nakamura
- G01 - MEASURING TESTING
Information Patent Grant
Signal transfer system, signal output circuit board, signal receivi...
- Patent number 7,800,912
- Issue date Sep 21, 2010
- Advantest Corporation
- Takayuki Nakamura
- G01 - MEASURING TESTING
Information Patent Grant
Driver circuit and test apparatus
- Patent number 7,755,377
- Issue date Jul 13, 2010
- Advantest Corporation
- Kensuke Kamo
- G01 - MEASURING TESTING
Information Patent Grant
Test apparatus and test method with features of adjusting phase dif...
- Patent number 7,707,484
- Issue date Apr 27, 2010
- Advantest Corporation
- Toshiaki Awaji
- G01 - MEASURING TESTING
Information Patent Grant
Test apparatus and pin electronics card
- Patent number 7,692,441
- Issue date Apr 6, 2010
- Advantest Corporation
- Naoki Matsumoto
- G01 - MEASURING TESTING
Information Patent Grant
Test apparatus and pin electronics card
- Patent number 7,679,390
- Issue date Mar 16, 2010
- Advantest Corporation
- Naoki Matsumoto
- G01 - MEASURING TESTING
Information Patent Grant
Driver circuit and test apparatus
- Patent number 7,589,549
- Issue date Sep 15, 2009
- Advantest Corporation
- Kensuke Kamo
- G01 - MEASURING TESTING
Information Patent Grant
Electronic device, circuit and test apparatus
- Patent number 7,557,561
- Issue date Jul 7, 2009
- Advantest Corporation
- Toshiaki Awaji
- G01 - MEASURING TESTING
Information Patent Grant
Driver circuit, test apparatus and adjusting method
- Patent number 7,538,582
- Issue date May 26, 2009
- Advantest Corporation
- Naoki Matsumoto
- G01 - MEASURING TESTING
Information Patent Grant
Driver circuit
- Patent number 7,528,637
- Issue date May 5, 2009
- Advantest Corporation
- Naoki Matsumoto
- G01 - MEASURING TESTING
Information Patent Grant
Test apparatus and test method
- Patent number 7,512,872
- Issue date Mar 31, 2009
- Advantest Corporation
- Toshiaki Awaji
- G01 - MEASURING TESTING
Information Patent Grant
Terminator circuit, test apparatus, test head, and communication de...
- Patent number 7,459,897
- Issue date Dec 2, 2008
- Advantest Corporation
- Toshiaki Awaji
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Test device and setting method
- Patent number 7,453,932
- Issue date Nov 18, 2008
- Advantest Corporation
- Toshiaki Awaji
- G01 - MEASURING TESTING
Information Patent Grant
High frequency delay circuit and test apparatus
- Patent number 7,394,238
- Issue date Jul 1, 2008
- Advantest Corporation
- Katsumi Ochiai
- G01 - MEASURING TESTING
Information Patent Grant
Temperature compensation circuit and testing apparatus
- Patent number 7,342,407
- Issue date Mar 11, 2008
- Advantest Corporation
- Yuji Kuwana
- G01 - MEASURING TESTING
Information Patent Grant
Differential comparator circuit, test head, and test apparatus
- Patent number 7,123,025
- Issue date Oct 17, 2006
- Advantest Corporation
- Toshiaki Awaji
- G01 - MEASURING TESTING
Information Patent Grant
Input-output circuit and a testing apparatus
- Patent number 7,013,230
- Issue date Mar 14, 2006
- Advantest Corporation
- Takashi Sekino
- G01 - MEASURING TESTING
Information Patent Grant
Correcting method of optical signal transmission system and optical...
- Patent number 6,678,478
- Issue date Jan 13, 2004
- Advantest Corporation
- Atsushi Ono
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Delay time control circuit
- Patent number 6,462,598
- Issue date Oct 8, 2002
- Advantest Corp.
- Toshiyuki Okayasu
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Voltage drive circuit, voltage drive apparatus and semiconductor-de...
- Patent number 6,294,949
- Issue date Sep 25, 2001
- Advantest Corporation
- Shoji Kojima
- G01 - MEASURING TESTING
Information Patent Grant
Delay time control circuit
- Patent number 5,869,992
- Issue date Feb 9, 1999
- Advantest Corp.
- Takashi Sekino
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Measuring board having an optically driven switch and I/O terminal...
- Patent number 5,821,529
- Issue date Oct 13, 1998
- Advantest Corporation
- Kazunori Chihara
- G01 - MEASURING TESTING
Information Patent Grant
IC testing device for permitting adjustment of timing of a test signal
- Patent number 5,225,775
- Issue date Jul 6, 1993
- Advantest Corporation
- Takashi Sekino
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
JITTER GENERATING CIRCUIT
- Publication number 20100201421
- Publication date Aug 12, 2010
- Advantest Corporation
- Takayuki Nakamura
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
Driver circuit
- Publication number 20100109788
- Publication date May 6, 2010
- Naoki Matsumoto
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
Driver circuit
- Publication number 20100060325
- Publication date Mar 11, 2010
- Naoki Matsumoto
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
TRANSMISSION PATH DRIVING CIRCUIT
- Publication number 20090322395
- Publication date Dec 31, 2009
- Advantest Corporation
- Takayuki Nakamura
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
DRIVER CIRCUIT AND TEST APPARATUS
- Publication number 20090209210
- Publication date Aug 20, 2009
- ADVANTEST CORPORATION
- Kensuke Kamo
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
TEST APPARATUS AND TEST METHOD
- Publication number 20090158103
- Publication date Jun 18, 2009
- Advantest Corporation
- Toshiaki Awaji
- G01 - MEASURING TESTING
Information Patent Application
TEST APPARATUS AND PIN ELECTRONICS CARD
- Publication number 20090146677
- Publication date Jun 11, 2009
- Advantest Corporation
- NAOKI MATSUMOTO
- G01 - MEASURING TESTING
Information Patent Application
Test apparatus, pin electronics card, electrical device and switch
- Publication number 20090134900
- Publication date May 28, 2009
- Advantest Corporation
- TOSHIAKI AWAJI
- G01 - MEASURING TESTING
Information Patent Application
DRIVER CIRCUIT AND TEST APPARATUS
- Publication number 20090128181
- Publication date May 21, 2009
- Advantest Corporation
- Kensuke Kamo
- G01 - MEASURING TESTING
Information Patent Application
DRIVER CIRCUIT AND TEST APPARATUS
- Publication number 20090128182
- Publication date May 21, 2009
- Advantest Corporation
- Kensuke Kamo
- G01 - MEASURING TESTING
Information Patent Application
HIGH FREQUENCY DELAY CIRCUIT AND TEST APPARATUS
- Publication number 20090051347
- Publication date Feb 26, 2009
- Advantest Corporation
- Katsumi Ochiai
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
TEST APPARATUS AND PIN ELECTRONICS CARD
- Publication number 20080284448
- Publication date Nov 20, 2008
- Advantest Corporation
- NAOKI MATSUMOTO
- G01 - MEASURING TESTING
Information Patent Application
HIGH FREQUENCY DELAY CIRCUIT AND TEST APPARATUS
- Publication number 20080143318
- Publication date Jun 19, 2008
- Advantest Corporation
- Katsumi Ochiai
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
Test apparatus and test method
- Publication number 20080120059
- Publication date May 22, 2008
- Advantest Corporation
- Toshiaki Awaji
- G01 - MEASURING TESTING
Information Patent Application
ELECTRONIC DEVICE, CIRCUIT AND TEST APPARATUS
- Publication number 20070262800
- Publication date Nov 15, 2007
- Advantest Corporation
- Toshiaki Awaji
- G01 - MEASURING TESTING
Information Patent Application
Terminator circuit, test apparatus, test head, and communication de...
- Publication number 20070257658
- Publication date Nov 8, 2007
- Advantest Corporation
- Toshiaki Awaji
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
Temperature compensation circuit and testing apparatus
- Publication number 20070176617
- Publication date Aug 2, 2007
- Advantest Corporation
- Yuji Kuwana
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
Driver circuit, test apparatus and adjusting method
- Publication number 20070103198
- Publication date May 10, 2007
- Advantest Corporation
- Naoki Matsumoto
- G01 - MEASURING TESTING
Information Patent Application
Driver circuit
- Publication number 20070001717
- Publication date Jan 4, 2007
- Advantest Corporation
- Naoki Matsumoto
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
Signal transfer system, signal output circuit board, signal receivi...
- Publication number 20060170517
- Publication date Aug 3, 2006
- Advantest Corporation
- Takayuki Nakamura
- G01 - MEASURING TESTING
Information Patent Application
Differential comparator circuit, test head, and test apparatus
- Publication number 20060033509
- Publication date Feb 16, 2006
- Advantest Corporation
- Toshiaki Awaji
- G01 - MEASURING TESTING
Information Patent Application
Test device and setting method
- Publication number 20050243906
- Publication date Nov 3, 2005
- Advantest Corporation
- Toshiaki Awaji
- G01 - MEASURING TESTING
Information Patent Application
High frequency delay circuit and test apparatus
- Publication number 20050225330
- Publication date Oct 13, 2005
- Advantest Corporation
- Katsumi Ochiai
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
Input-output circuit and a testing apparatus
- Publication number 20040145375
- Publication date Jul 29, 2004
- Takashi Sekino
- G01 - MEASURING TESTING

Takashi Sekino

Person

Patents Grantslast 30 patents

Driver circuit

Driver circuit for producing signal simulating transmission loss

Driver circuit and test apparatus

Transmission line driving circuit

Test apparatus, pin electronics card, electrical device and switch

Jitter generating circuit

Signal transfer system, signal output circuit board, signal receivi...

Driver circuit and test apparatus

Test apparatus and test method with features of adjusting phase dif...

Test apparatus and pin electronics card

Test apparatus and pin electronics card

Driver circuit and test apparatus

Electronic device, circuit and test apparatus

Driver circuit, test apparatus and adjusting method

Driver circuit

Test apparatus and test method

Terminator circuit, test apparatus, test head, and communication de...

Test device and setting method

High frequency delay circuit and test apparatus

Temperature compensation circuit and testing apparatus

Differential comparator circuit, test head, and test apparatus

Input-output circuit and a testing apparatus

Correcting method of optical signal transmission system and optical...

Delay time control circuit

Voltage drive circuit, voltage drive apparatus and semiconductor-de...

Delay time control circuit

Measuring board having an optically driven switch and I/O terminal...

IC testing device for permitting adjustment of timing of a test signal

Patents Applicationslast 30 patents

JITTER GENERATING CIRCUIT

Driver circuit

Driver circuit

TRANSMISSION PATH DRIVING CIRCUIT

DRIVER CIRCUIT AND TEST APPARATUS

TEST APPARATUS AND TEST METHOD

TEST APPARATUS AND PIN ELECTRONICS CARD

Test apparatus, pin electronics card, electrical device and switch

DRIVER CIRCUIT AND TEST APPARATUS

DRIVER CIRCUIT AND TEST APPARATUS

HIGH FREQUENCY DELAY CIRCUIT AND TEST APPARATUS

TEST APPARATUS AND PIN ELECTRONICS CARD

HIGH FREQUENCY DELAY CIRCUIT AND TEST APPARATUS

Test apparatus and test method

ELECTRONIC DEVICE, CIRCUIT AND TEST APPARATUS

Terminator circuit, test apparatus, test head, and communication de...

Temperature compensation circuit and testing apparatus

Driver circuit, test apparatus and adjusting method

Driver circuit

Signal transfer system, signal output circuit board, signal receivi...

Differential comparator circuit, test head, and test apparatus

Test device and setting method

High frequency delay circuit and test apparatus

Input-output circuit and a testing apparatus