Takashi Shoji

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Osaka, JP

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Patents Grantslast 30 patents

Information Patent Grant
X-ray fluorescence spectrometer and program for use therewith
- Patent number 7,450,685
- Issue date Nov 11, 2008
- Rigaku Industrial Corporation
- Yoshiyuki Kataoka
- G01 - MEASURING TESTING
Information Patent Grant
Fluorescent X-ray analyzer useable as wavelength dispersive type an...
- Patent number 6,292,532
- Issue date Sep 18, 2001
- Rigaku Industrial Corporation
- Naoki Kawahara
- G01 - MEASURING TESTING
Information Patent Grant
Fluorescent X-ray analyzing apparatus
- Patent number 5,732,120
- Issue date Mar 24, 1998
- Rigaku Industrial Corporation
- Takashi Shoji
- G01 - MEASURING TESTING
Information Patent Grant
X-ray analysis apparatus
- Patent number 5,406,609
- Issue date Apr 11, 1995
- Rigaku Industrial Corporation
- Tomoya Arai
- B82 - NANO-TECHNOLOGY
Information Patent Grant
X-ray spectroscope
- Patent number 4,256,961
- Issue date Mar 17, 1981
- Rigaku Industrial Corporation
- Takashi Shoji
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
X-ray fluorescence spectrometer and program for use therewith
- Publication number 20070086567
- Publication date Apr 19, 2007
- RIGAKU INDUSTRIAL CORPORATION
- Yoshiyuki Kataoka
- G01 - MEASURING TESTING
Information Patent Application
X-ray fluorescence analyzer
- Publication number 20060153332
- Publication date Jul 13, 2006
- Hisayuki Kohno
- G01 - MEASURING TESTING