Takashi Tase

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Tokorozawa, JP

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Patents Grantslast 30 patents

Information Patent Grant
Standard member for calibration and method of manufacturing the sam...
- Patent number 8,735,816
- Issue date May 27, 2014
- Hitachi High-Technologies Corporation
- Yoshinori Nakayama
- B32 - LAYERED PRODUCTS
Information Patent Grant
Calibration standard member, method for manufacturing the member an...
- Patent number 8,373,113
- Issue date Feb 12, 2013
- Hitachi High-Technologies Corporation
- Yoshinori Nakayama
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Semiconductor integrated circuit device, IC card, and mobile terminal
- Patent number 7,228,377
- Issue date Jun 5, 2007
- Renesas, Technology Corp.
- Takanori Yamazoe
- G06 - COMPUTING CALCULATING COUNTING

Patents Applicationslast 30 patents

Information Patent Application
STANDARD MEMBER FOR CALIBRATION AND METHOD OF MANUFACTURING THE SAM...
- Publication number 20130299699
- Publication date Nov 14, 2013
- Yoshinori Nakayama
- B32 - LAYERED PRODUCTS
Information Patent Application
CALIBRATION STANDARD MEMBER, METHOD FOR MANUFACTURING THE MEMBER AN...
- Publication number 20110210250
- Publication date Sep 1, 2011
- Hitachi High-Technologies Corporation
- Yoshinori Nakayama
- G01 - MEASURING TESTING
Information Patent Application
Semiconductor device and method for fabricating the same
- Publication number 20050062135
- Publication date Mar 24, 2005
- Takashi Tase
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Semiconductor integrated circuit device, IC card, and mobile terminal
- Publication number 20040252561
- Publication date Dec 16, 2004
- Takanori Yamazoe
- G06 - COMPUTING CALCULATING COUNTING