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Takashi Tokuno
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Gyoda, JP
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last 30 patents
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Patent Grant
Logical waveform generator
Patent number
4,310,802
Issue date
Jan 12, 1982
Nippon Telegraph & Telephone Public Corp.
Yoshichika Ichimiya
G01 - MEASURING TESTING
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Patent Grant
Address pattern generator for testing a memory
Patent number
4,300,234
Issue date
Nov 10, 1981
Nippon Telegraph & Telephone Public Corporation
Hiromi Maruyama
G11 - INFORMATION STORAGE
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Patent Grant
Test pattern generating apparatus
Patent number
4,293,950
Issue date
Oct 6, 1981
Nippon Telegraph & Telephone Public Corporation
Masao Shimizu
G11 - INFORMATION STORAGE