Takashi YAMADA

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Patents Grantslast 30 patents

Information Patent Grant
Wavelength dispersive X-ray fluorescence spectrometer
- Patent number 10,948,436
- Issue date Mar 16, 2021
- Rigaku Corporation
- Shuichi Kato
- G01 - MEASURING TESTING
Information Patent Grant
Wavelength dispersive x-ray fluorescence spectrometer and x-ray flu...
- Patent number 10,768,125
- Issue date Sep 8, 2020
- Rigaku Corporation
- Shuichi Kato
- G01 - MEASURING TESTING
Information Patent Grant
Grazing incidence x-ray fluorescence spectrometer and grazing incid...
- Patent number 10,302,579
- Issue date May 28, 2019
- Rigaku Corporation
- Kazuhiko Omote
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Grant
X-ray fluorescence spectrometer and X-ray fluorescence analyzing me...
- Patent number 9,746,433
- Issue date Aug 29, 2017
- Rigaku Corporation
- Takashi Yamada
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
WAVELENGTH DISPERSIVE X-RAY FLUORESCENCE SPECTROMETER
- Publication number 20190227008
- Publication date Jul 25, 2019
- Rigaku Corporation
- Shuichi KATO
- G01 - MEASURING TESTING
Information Patent Application
WAVELENGTH DISPERSIVE X-RAY FLUORESCENCE SPECTROMETER AND X-RAY FLU...
- Publication number 20190072504
- Publication date Mar 7, 2019
- Rigaku Corporation
- Shuichi KATO
- G01 - MEASURING TESTING
Information Patent Application
GRAZING INCIDENCE X-RAY FLUORESCENCE SPECTROMETER AND GRAZING INCID...
- Publication number 20170284949
- Publication date Oct 5, 2017
- Rigaku Corporation
- Kazuhiko OMOTE
- G01 - MEASURING TESTING
Information Patent Application
X-RAY FLUORESCENCE SPECTROMETER AND X-RAY FLUORESCENCE ANALYZING ME...
- Publication number 20170108424
- Publication date Apr 20, 2017
- Rigaku Corporation
- Takashi YAMADA
- G01 - MEASURING TESTING