Takashi Yanaka

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Hino, JP

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Patents Grantslast 30 patents

Information Patent Grant
Electron beam apparatus with improved specimen holder
- Patent number 4,596,934
- Issue date Jun 24, 1986
- International Precision Inc.
- Takashi Yanaka
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method of photographing electron microscope images on a single phot...
- Patent number 4,316,087
- Issue date Feb 16, 1982
- International Precision Incorporated
- Takashi Yanaka
- H01 - BASIC ELECTRIC ELEMENTS