Takashi Yasuda

Person

Hamamatsu-shi, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Wave plate and divided prism member
- Patent number 10,908,355
- Issue date Feb 2, 2021
- HAMAMATSU PHOTONICS K.K.
- Yoichi Kawada
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Terahertz wave spectroscopic measurement apparatus and terahertz wa...
- Patent number 10,895,504
- Issue date Jan 19, 2021
- Hamamatsu Photonics K.K.
- Takashi Yasuda
- G01 - MEASURING TESTING
Information Patent Grant
Wave plate and divided prism member
- Patent number 10,591,669
- Issue date Mar 17, 2020
- Hamamatsu Photonics K.K.
- Yoichi Kawada
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Non-linear optical crystal and method for manufacturing same, and t...
- Patent number 10,248,003
- Issue date Apr 2, 2019
- Hamamatsu Photonics K.K.
- Kouichiro Akiyama
- C07 - ORGANIC CHEMISTRY
Information Patent Grant
Terahertz-wave spectrometer
- Patent number 9,696,206
- Issue date Jul 4, 2017
- Hamamatsu Photonics K.K.
- Takashi Yasuda
- G01 - MEASURING TESTING
Information Patent Grant
Electric field vector detection method and electric field vector de...
- Patent number 9,612,153
- Issue date Apr 4, 2017
- Hamamatsu Photonics K.K.
- Yoichi Kawada
- G01 - MEASURING TESTING
Information Patent Grant
Terahertz wave temporal waveform acquistion apparatus
- Patent number 9,417,183
- Issue date Aug 16, 2016
- Hamamatsu Photonics K.K.
- Atsushi Nakanishi
- G01 - MEASURING TESTING
Information Patent Grant
Prism member, terahertz-wave spectroscopic measurement device, and...
- Patent number 9,417,182
- Issue date Aug 16, 2016
- Hamamatsu Photonics K.K.
- Kouichiro Akiyama
- G01 - MEASURING TESTING
Information Patent Grant
Method for designing laser-light-shaping optical component, method...
- Patent number 9,373,927
- Issue date Jun 21, 2016
- Hamamatsu Photonics K.K.
- Haruyasu Ito
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information Patent Grant
Terahertz-wave spectrometer and prism member
- Patent number 9,080,913
- Issue date Jul 14, 2015
- Hamamatsu Photonics K.K.
- Takashi Yasuda
- G01 - MEASURING TESTING
Information Patent Grant
Electromagnetic wave detection device
- Patent number 8,993,967
- Issue date Mar 31, 2015
- Hamamatsu Photonics K.K.
- Yoichi Kawada
- G01 - MEASURING TESTING
Information Patent Grant
Optical system for laser optical rectification and wave front control
- Patent number 8,810,890
- Issue date Aug 19, 2014
- Hamamatsu Photonics K.K.
- Haruyasu Ito
- G02 - OPTICS
Information Patent Grant
Single terahertz wave time-waveform measuring device
- Patent number 8,742,353
- Issue date Jun 3, 2014
- Hamamatsu Photonics K.K.
- Yoichi Kawada
- G01 - MEASURING TESTING
Information Patent Grant
Terahertz wave generation device
- Patent number 8,564,875
- Issue date Oct 22, 2013
- Hamamatsu Photonics K.K.
- Yoichi Kawada
- G02 - OPTICS
Information Patent Grant
Total reflection terahertz wave measurement device
- Patent number 8,415,625
- Issue date Apr 9, 2013
- Hamamatsu Photonics K.K.
- Atsushi Nakanishi
- G01 - MEASURING TESTING
Information Patent Grant
Total reflection tera hertz wave measuring apparatus
- Patent number 8,354,644
- Issue date Jan 15, 2013
- Hamamatsu Photonics K.K.
- Takashi Yasuda
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
ADSORPTION EVALUATION APPARATUS AND ADSORPTION EVALUATION METHOD
- Publication number 20240337597
- Publication date Oct 10, 2024
- HAMAMATSU PHOTONICS K. K.
- Takashi Yasuda
- G01 - MEASURING TESTING
Information Patent Application
OPTICAL ELEMENT
- Publication number 20230130965
- Publication date Apr 27, 2023
- HAMAMATSU PHOTONICS K. K.
- Yoichi KAWADA
- G02 - OPTICS
Information Patent Application
SPECTROSCOPIC MEASUREMENT DEVICE
- Publication number 20220404274
- Publication date Dec 22, 2022
- HAMAMATSU PHOTONICS K. K.
- Takayoshi KUGA
- G01 - MEASURING TESTING
Information Patent Application
WAVE PLATE AND DIVIDED PRISM MEMBER
- Publication number 20200150339
- Publication date May 14, 2020
- HAMAMATSU PHOTONICS K. K.
- Yoichi KAWADA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
TERAHERTZ WAVE SPECTROSCOPIC MEASUREMENT APPARATUS AND TERAHERTZ WA...
- Publication number 20190025124
- Publication date Jan 24, 2019
- HAMAMATSU PHOTONICS K. K.
- Takashi YASUDA
- G01 - MEASURING TESTING
Information Patent Application
NON-LINEAR OPTICAL CRYSTAL AND METHOD FOR MANUFACTURING SAME, AND T...
- Publication number 20170248833
- Publication date Aug 31, 2017
- Hamamatsu Photonics K.K.
- Kouichiro Akiyama
- G02 - OPTICS
Information Patent Application
TERAHERTZ WAVE TEMPORAL WAVEFORM ACQUISTION APPARATUS
- Publication number 20160202179
- Publication date Jul 14, 2016
- HAMAMATSU PHOTONICS K. K.
- Atsushi NAKANISHI
- G01 - MEASURING TESTING
Information Patent Application
WAVE PLATE AND DIVIDED PRISM MEMBER
- Publication number 20160154176
- Publication date Jun 2, 2016
- Hamamatsu Photonics K. K.
- Yoichi KAWADA
- G02 - OPTICS
Information Patent Application
ELECTRIC FIELD VECTOR DETECTION METHOD AND ELECTRIC FIELD VECTOR DE...
- Publication number 20160146666
- Publication date May 26, 2016
- HAMAMATSU PHOTONICS K. K.
- Yoichi KAWADA
- G01 - MEASURING TESTING
Information Patent Application
PRISM MEMBER, TERAHERTZ-WAVE SPECTROSCOPIC MEASUREMENT DEVICE, AND...
- Publication number 20150136986
- Publication date May 21, 2015
- Hamamatsu Photonics K.K.
- Kouichiro Akiyama
- G01 - MEASURING TESTING
Information Patent Application
METHOD FOR DESIGNING LASER-LIGHT-SHAPING OPTICAL COMPONENT, METHOD...
- Publication number 20140348190
- Publication date Nov 27, 2014
- Haruyasu Ito
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information Patent Application
TERAHERTZ-WAVE SPECTROMETER
- Publication number 20140014840
- Publication date Jan 16, 2014
- Hamamatsu Photonics K.K.
- Takashi Yasuda
- G01 - MEASURING TESTING
Information Patent Application
TOTAL REFLECTION SPECTROSCOPIC MEASUREMENT METHOD
- Publication number 20140008541
- Publication date Jan 9, 2014
- Hamamatsu Photonics K.K.
- Kouichiro Akiyama
- G01 - MEASURING TESTING
Information Patent Application
TERAHERTZ-WAVE SPECTROMETER AND PRISM MEMBER
- Publication number 20140008540
- Publication date Jan 9, 2014
- Hamamatsu Photonics K.K.
- Takashi Yasuda
- G01 - MEASURING TESTING
Information Patent Application
OPTICAL SYSTEM FOR LASER OPTICAL RECTIFICATION AND WAVE FRONT CONTROL
- Publication number 20130107346
- Publication date May 2, 2013
- Hamamatsu Photonics K.K.
- Haruyasu ITO
- G02 - OPTICS
Information Patent Application
ELECTROMAGNETIC WAVE DETECTION DEVICE
- Publication number 20120326041
- Publication date Dec 27, 2012
- Hamamatsu Photonics K.K.
- Yoichi Kawada
- G01 - MEASURING TESTING
Information Patent Application
LASER LIGHT SHAPING OPTICAL SYSTEM
- Publication number 20120206924
- Publication date Aug 16, 2012
- HAMAMATSU PHOTONICS K. K.
- Haruyasu Ito
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information Patent Application
LASER LIGHT SHAPING AND WAVEFRONT CONTROLLING OPTICAL SYSTEM
- Publication number 20120206786
- Publication date Aug 16, 2012
- HAMAMATSU PHOTONICS K. K.
- Haruyasu ITO
- G02 - OPTICS
Information Patent Application
TOTAL REFLECTION TERAHERTZ WAVE MEASUREMENT DEVICE
- Publication number 20110249253
- Publication date Oct 13, 2011
- HAMAMATSU PHOTONICS K. K.
- Atsushi Nakanishi
- G01 - MEASURING TESTING
Information Patent Application
TERAHERTZ WAVE GENERATION DEVICE
- Publication number 20110242642
- Publication date Oct 6, 2011
- HAMAMATSU PHOTONICS K. K.
- Yoichi Kawada
- G02 - OPTICS
Information Patent Application
SINGLE TERAHERTZ WAVE TIME-WAVEFORM MEASURING DEVICE
- Publication number 20100090112
- Publication date Apr 15, 2010
- HAMAMATSU PHOTONICS K.K.
- Yoichi Kawada
- G01 - MEASURING TESTING
Information Patent Application
TOTAL REFLECTION TERA HERTZ WAVE MEASURING APPARATUS
- Publication number 20100091266
- Publication date Apr 15, 2010
- Hamamatsu Photonics K.K.
- Takashi Yasuda
- G01 - MEASURING TESTING

Takashi Yasuda

Person

Patents Grantslast 30 patents

Wave plate and divided prism member

Terahertz wave spectroscopic measurement apparatus and terahertz wa...

Wave plate and divided prism member

Non-linear optical crystal and method for manufacturing same, and t...

Terahertz-wave spectrometer

Electric field vector detection method and electric field vector de...

Terahertz wave temporal waveform acquistion apparatus

Prism member, terahertz-wave spectroscopic measurement device, and...

Method for designing laser-light-shaping optical component, method...

Terahertz-wave spectrometer and prism member

Electromagnetic wave detection device

Optical system for laser optical rectification and wave front control

Single terahertz wave time-waveform measuring device

Terahertz wave generation device

Total reflection terahertz wave measurement device

Total reflection tera hertz wave measuring apparatus

Patents Applicationslast 30 patents

ADSORPTION EVALUATION APPARATUS AND ADSORPTION EVALUATION METHOD

OPTICAL ELEMENT

SPECTROSCOPIC MEASUREMENT DEVICE

WAVE PLATE AND DIVIDED PRISM MEMBER

TERAHERTZ WAVE SPECTROSCOPIC MEASUREMENT APPARATUS AND TERAHERTZ WA...

NON-LINEAR OPTICAL CRYSTAL AND METHOD FOR MANUFACTURING SAME, AND T...

TERAHERTZ WAVE TEMPORAL WAVEFORM ACQUISTION APPARATUS

WAVE PLATE AND DIVIDED PRISM MEMBER

ELECTRIC FIELD VECTOR DETECTION METHOD AND ELECTRIC FIELD VECTOR DE...

PRISM MEMBER, TERAHERTZ-WAVE SPECTROSCOPIC MEASUREMENT DEVICE, AND...

METHOD FOR DESIGNING LASER-LIGHT-SHAPING OPTICAL COMPONENT, METHOD...

TERAHERTZ-WAVE SPECTROMETER

TOTAL REFLECTION SPECTROSCOPIC MEASUREMENT METHOD

TERAHERTZ-WAVE SPECTROMETER AND PRISM MEMBER

OPTICAL SYSTEM FOR LASER OPTICAL RECTIFICATION AND WAVE FRONT CONTROL

ELECTROMAGNETIC WAVE DETECTION DEVICE

LASER LIGHT SHAPING OPTICAL SYSTEM

LASER LIGHT SHAPING AND WAVEFRONT CONTROLLING OPTICAL SYSTEM

TOTAL REFLECTION TERAHERTZ WAVE MEASUREMENT DEVICE

TERAHERTZ WAVE GENERATION DEVICE

SINGLE TERAHERTZ WAVE TIME-WAVEFORM MEASURING DEVICE

TOTAL REFLECTION TERA HERTZ WAVE MEASURING APPARATUS