Takashi Yokokura

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Hino, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Interferometer for measuring aspherical form with the utilization o...
- Patent number 5,039,223
- Issue date Aug 13, 1991
- Kabushiki Kaisha Topcon
- Takashi Gemma
- G01 - MEASURING TESTING
Information Patent Grant
Light wave range finder
- Patent number 4,986,653
- Issue date Jan 22, 1991
- Kabushiki Kaisha Topcon
- Takashi Yokokura
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for finding range
- Patent number 4,973,153
- Issue date Nov 27, 1990
- Kabushiki Kaisha Topcon
- Takashi Yokokura
- G01 - MEASURING TESTING
Information Patent Grant
Integrated-photocircuit interferometer
- Patent number 4,941,744
- Issue date Jul 17, 1990
- Tokyo Kogaku Kikai Kabushiki Kaisha
- Takashi Yokokura
- G01 - MEASURING TESTING
Information Patent Grant
Light interferometer
- Patent number 4,909,629
- Issue date Mar 20, 1990
- Kabushiki Kaisha Topcon
- Takashi Yokokura
- G01 - MEASURING TESTING
Information Patent Grant
Method of and apparatus for analyzing interference fringes
- Patent number 4,848,907
- Issue date Jul 18, 1989
- Tokyo Kogaku Kikai Kabushiki
- Takashi Yokokura
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Holographic interferometer
- Patent number 4,812,042
- Issue date Mar 14, 1989
- Takashi Yokokura
- G01 - MEASURING TESTING
Information Patent Grant
Holographic interferometer
- Patent number 4,758,089
- Issue date Jul 19, 1988
- Tokyo Kogaku Kikai Kabushiki Kaisha
- Takashi Yokokura
- G01 - MEASURING TESTING
Information Patent Grant
Inclination measuring instrument
- Patent number 4,660,290
- Issue date Apr 28, 1987
- Tokyo Kagaku Kikai Kabushiki Kaisha
- Nobuo Hori
- G01 - MEASURING TESTING
Information Patent Grant
Tilt angle detection device
- Patent number 4,628,612
- Issue date Dec 16, 1986
- Tokyo Kogaku Kikai Kabushiki Kaisha
- Nobuo Hori
- G01 - MEASURING TESTING
Information Patent Grant
Displacement measuring device utilizing an incremental code
- Patent number 4,580,046
- Issue date Apr 1, 1986
- Tokyo Kogaku Kikai Kabushiki Kaisha
- Tsuneo Sasaki
- G01 - MEASURING TESTING
Information Patent Grant
Displacement measuring device utilizing an incremental code
- Patent number 4,580,047
- Issue date Apr 1, 1986
- Tokyo Kogaku Kikai Kabushiki Kaisha
- Tsuneo Sasaki
- G01 - MEASURING TESTING
Information Patent Grant
Displacement measuring device utilizing an incremental code
- Patent number 4,547,667
- Issue date Oct 15, 1985
- Tokyo Kogaku Kikai Kabushiki Kaisha
- Tsuneo Sasaki
- G01 - MEASURING TESTING

Takashi Yokokura

Person

Patents Grantslast 30 patents

Interferometer for measuring aspherical form with the utilization o...

Light wave range finder

Method and apparatus for finding range

Integrated-photocircuit interferometer

Light interferometer

Method of and apparatus for analyzing interference fringes

Holographic interferometer

Holographic interferometer

Inclination measuring instrument

Tilt angle detection device

Displacement measuring device utilizing an incremental code

Displacement measuring device utilizing an incremental code

Displacement measuring device utilizing an incremental code