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Takashi Yoshida
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Akashi-shi, JP
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Patents Grants
last 30 patents
Information
Patent Grant
Sample pretreatment apparatus, robotic arm, and sample pretreatment...
Patent number
11,275,095
Issue date
Mar 15, 2022
Sysmex Corporation
Takashi Yoshida
G01 - MEASURING TESTING
Information
Patent Grant
Specimen analyzer and specimen analysis method
Patent number
11,268,969
Issue date
Mar 8, 2022
Sysmex Corporation
Seiji Takemoto
G01 - MEASURING TESTING
Information
Patent Grant
Specimen analyzer and specimen analysis method for controlling an o...
Patent number
11,249,096
Issue date
Feb 15, 2022
Sysmex Corporation
Seiji Takemoto
G01 - MEASURING TESTING
Information
Patent Grant
Specimen analyzer and specimen analysis method
Patent number
10,520,518
Issue date
Dec 31, 2019
SYSMEX CORPORATION
Seiji Takemoto
G01 - MEASURING TESTING
Information
Patent Grant
Specimen analyzer and specimen analysis method
Patent number
10,192,637
Issue date
Jan 29, 2019
SYSMEX CORPORATION
Seiji Takemoto
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
System for providing animal test information and method of providin...
Patent number
8,086,411
Issue date
Dec 27, 2011
Sysmex Corporation
Takashi Yoshida
G01 - MEASURING TESTING
Information
Patent Grant
Sample analyzer and its components
Patent number
7,988,914
Issue date
Aug 2, 2011
SYSMEX CORPORATION
Toshikatsu Fukuju
G01 - MEASURING TESTING
Information
Patent Grant
Sample analyzer and its components
Patent number
7,919,044
Issue date
Apr 5, 2011
Sysmex Corporation
Toshikatsu Fukuju
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
MAINTENANCE METHOD
Publication number
20240427720
Publication date
Dec 26, 2024
SYSMEX CORPORATION
Takashi Yoshida
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
MANAGEMENT METHOD
Publication number
20240428933
Publication date
Dec 26, 2024
SYSMEX CORPORATION
Takashi YOSHIDA
G01 - MEASURING TESTING
Information
Patent Application
SPECIMEN ANALYZER AND SPECIMEN ANALYSIS METHOD
Publication number
20220155329
Publication date
May 19, 2022
SYSMEX CORPORATION
Seiji TAKEMOTO
G01 - MEASURING TESTING
Information
Patent Application
SPECIMEN ANALYZER AND SPECIMEN ANALYSIS METHOD
Publication number
20200103427
Publication date
Apr 2, 2020
SYSMEX CORPORATION
Seiji TAKEMOTO
G01 - MEASURING TESTING
Information
Patent Application
SAMPLE PRETREATMENT APPARATUS, ROBOTIC ARM, AND SAMPLE PRETREATMENT...
Publication number
20190302135
Publication date
Oct 3, 2019
SYSMEX CORPORATION
Takashi YOSHIDA
G01 - MEASURING TESTING
Information
Patent Application
SPECIMEN ANALYZER AND SPECIMEN ANALYSIS METHOD
Publication number
20180348241
Publication date
Dec 6, 2018
SYSMEX CORPORATION
Seiji TAKEMOTO
G01 - MEASURING TESTING
Information
Patent Application
Specimen analyzer and specimen analysis method
Publication number
20180349564
Publication date
Dec 6, 2018
SYSMEX CORPORATION
Seiji TAKEMOTO
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
SPECIMEN ANALYZER AND SPECIMEN ANALYSIS METHOD
Publication number
20180348242
Publication date
Dec 6, 2018
SYSMEX CORPORATION
Seiji TAKEMOTO
G01 - MEASURING TESTING
Information
Patent Application
SPECIMEN ANALYZER AND SPECIMEN ANALYSIS METHOD
Publication number
20180348243
Publication date
Dec 6, 2018
SYSMEX CORPORATION
Seiji TAKEMOTO
G01 - MEASURING TESTING
Information
Patent Application
SYSTEM FOR PROVIDING ANIMAL TEST INFORMATION AND METHOD OF PROVIDIN...
Publication number
20120072126
Publication date
Mar 22, 2012
Sysmex Corporation
Takashi Yoshida
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
System for providing animal test information and method of providin...
Publication number
20090254284
Publication date
Oct 8, 2009
Takashi Yoshida
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
Sample Analyzer and Its Components
Publication number
20080219886
Publication date
Sep 11, 2008
Toshikatsu Fukuju
B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
Information
Patent Application
SAMPLE ANALYZER AND ITS COMPONENTS
Publication number
20080063568
Publication date
Mar 13, 2008
Toshikatsu Fukuju
B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
Information
Patent Application
Sample analyzer and its components
Publication number
20040105784
Publication date
Jun 3, 2004
Toshikatsu Fukuju
B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL