Takaya Noguchi

Person

Tokyo, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Semiconductor test apparatus and semiconductor test method
- Patent number 12,007,414
- Issue date Jun 11, 2024
- Mitsubishi Electric Corporation
- Yoshiyuki Ueda
- G01 - MEASURING TESTING
Information Patent Grant
Semiconductor manufacturing apparatus and method of manufacturing s...
- Patent number 11,901,201
- Issue date Feb 13, 2024
- Mitsubishi Electric Corporation
- Shunichi Kawakami
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Electrical characteristic inspection device for semiconductor devic...
- Patent number 11,828,786
- Issue date Nov 28, 2023
- Mitsubishi Electric Corporation
- Sumito Ogata
- G01 - MEASURING TESTING
Information Patent Grant
Semiconductor test apparatus, semiconductor device test method, and...
- Patent number 11,380,596
- Issue date Jul 5, 2022
- Mitsubishi Electric Corporation
- Yuji Ebiike
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Evaluation apparatus of semiconductor device and method of evaluati...
- Patent number 10,725,086
- Issue date Jul 28, 2020
- Mitsubishi Electric Corporation
- Akira Okada
- G01 - MEASURING TESTING
Information Patent Grant
Evaluation apparatus for semiconductor device and evaluation method...
- Patent number 10,495,668
- Issue date Dec 3, 2019
- Mitsubishi Electric Corporation
- Takaya Noguchi
- G01 - MEASURING TESTING
Information Patent Grant
Evaluation apparatus for semiconductor device and evaluation method...
- Patent number 10,459,005
- Issue date Oct 29, 2019
- Mitsubishi Electric Corporation
- Takaya Noguchi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Evaluation apparatus and evaluation method
- Patent number 10,436,833
- Issue date Oct 8, 2019
- Mitsubishi Electric Corporation
- Akira Okada
- G05 - CONTROLLING REGULATING
Information Patent Grant
Device and method for inspecting position of probe, and semiconduct...
- Patent number 10,359,448
- Issue date Jul 23, 2019
- Mitsubishi Electric Corporation
- Akira Okada
- G01 - MEASURING TESTING
Information Patent Grant
Probe position inspection apparatus, semiconductor device inspectio...
- Patent number 10,209,273
- Issue date Feb 19, 2019
- Mitsubishi Electric Corporation
- Norihiro Takesako
- G01 - MEASURING TESTING
Information Patent Grant
Semiconductor device evaluation jig, semiconductor device evaluatio...
- Patent number 10,168,380
- Issue date Jan 1, 2019
- Mitsubishi Electric Corporation
- Takaya Noguchi
- G01 - MEASURING TESTING
Information Patent Grant
Evaluation apparatus and probe position inspection method
- Patent number 9,804,197
- Issue date Oct 31, 2017
- Mitsubishi Electric Corporation
- Norihiro Takesako
- G01 - MEASURING TESTING
Information Patent Grant
Measuring apparatus and measuring method utilizing insulating liquid
- Patent number 9,684,015
- Issue date Jun 20, 2017
- Mitsubishi Electric Corporation
- Akira Okada
- G01 - MEASURING TESTING
Information Patent Grant
Measuring apparatus
- Patent number 9,684,027
- Issue date Jun 20, 2017
- Mitsubishi Electric Corporation
- Takaya Noguchi
- G01 - MEASURING TESTING
Information Patent Grant
Semiconductor evaluation apparatus
- Patent number 9,678,143
- Issue date Jun 13, 2017
- Mitsubishi Electric Corporation
- Akira Okada
- G01 - MEASURING TESTING
Information Patent Grant
Foreign matter removal device and foreign matter removal method
- Patent number 9,659,795
- Issue date May 23, 2017
- Mitsubishi Electric Corporation
- Akira Okada
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Measurement device
- Patent number 9,562,929
- Issue date Feb 7, 2017
- Mitsubishi Electric Corporation
- Takaya Noguchi
- G01 - MEASURING TESTING
Information Patent Grant
Semiconductor testing jig and transfer jig for the same
- Patent number 9,257,316
- Issue date Feb 9, 2016
- Mitsubishi Electric Corporation
- Akira Okada
- G01 - MEASURING TESTING
Information Patent Grant
Semiconductor cleaning device and semiconductor cleaning method
- Patent number 9,117,656
- Issue date Aug 25, 2015
- Mitsubishi Electric Corporation
- Akira Okada
- B08 - CLEANING
Information Patent Grant
Test apparatus and test method
- Patent number 8,980,655
- Issue date Mar 17, 2015
- Mitsubishi Electric Corporation
- Akira Okada
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
METHOD OF MANUFACTURING SEMICONDUCTOR DEVICE AND SEMICONDUCTOR MANU...
- Publication number 20240404892
- Publication date Dec 5, 2024
- Mitsubishi Electric Corporation
- Kazutoshi NAKASHIMA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SEMICONDUCTOR TEST APPARATUS AND SEMICONDUCTOR TEST METHOD
- Publication number 20240219426
- Publication date Jul 4, 2024
- Mitsubishi Electric Corporation
- Yoshiyuki Ueda
- G01 - MEASURING TESTING
Information Patent Application
SEMICONDUCTOR DEVICE
- Publication number 20240203830
- Publication date Jun 20, 2024
- Mitsubishi Electric Corporation
- Masanori TSUKUDA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SEMICONDUCTOR MANUFACTURING APPARATUS AND METHOD OF MANUFACTURING S...
- Publication number 20230131572
- Publication date Apr 27, 2023
- Mitsubishi Electric Corporation
- Shunichi KAWAKAMI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SEMICONDUCTOR TEST APPARATUS AND SEMICONDUCTOR TEST METHOD
- Publication number 20220244292
- Publication date Aug 4, 2022
- Mitsubishi Electric Corporation
- Yoshiyuki Ueda
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ELECTRICAL CHARACTERISTIC INSPECTION DEVICE FOR SEMICONDUCTOR DEVIC...
- Publication number 20220229103
- Publication date Jul 21, 2022
- Mitsubishi Electric Corporation
- Sumito OGATA
- G01 - MEASURING TESTING
Information Patent Application
SEMICONDUCTOR TEST APPARATUS, SEMICONDUCTOR DEVICE TEST METHOD, AND...
- Publication number 20210098314
- Publication date Apr 1, 2021
- Mitsubishi Electric Corporation
- Yuji EBIIKE
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
EVALUATION APPARATUS OF SEMICONDUCTOR DEVICE AND METHOD OF EVALUATI...
- Publication number 20180180659
- Publication date Jun 28, 2018
- Mitsubishi Electric Corporation
- Akira OKADA
- G01 - MEASURING TESTING
Information Patent Application
EVALUATION APPARATUS AND EVALUATION METHOD
- Publication number 20180180660
- Publication date Jun 28, 2018
- Mitsubishi Electric Corporation
- Akira OKADA
- G05 - CONTROLLING REGULATING
Information Patent Application
SEMICONDUCTOR DEVICE EVALUATION JIG, SEMICONDUCTOR DEVICE EVALUATIO...
- Publication number 20180088169
- Publication date Mar 29, 2018
- Mitsubishi Electric Corporation
- Takaya NOGUCHI
- G01 - MEASURING TESTING
Information Patent Application
DEVICE AND METHOD FOR INSPECTING POSITION OF PROBE, AND SEMICONDUCT...
- Publication number 20170299630
- Publication date Oct 19, 2017
- Mitsubishi Electric Corporation
- Akira OKADA
- G01 - MEASURING TESTING
Information Patent Application
EVALUATION APPARATUS AND PROBE POSITION INSPECTION METHOD
- Publication number 20170199225
- Publication date Jul 13, 2017
- Mitsubishi Electric Corporation
- Norihiro TAKESAKO
- G01 - MEASURING TESTING
Information Patent Application
EVALUATION APPARATUS FOR SEMICONDUCTOR DEVICE AND EVALUATION METHOD...
- Publication number 20170138984
- Publication date May 18, 2017
- Mitsubishi Electric Corporation
- Takaya NOGUCHI
- G01 - MEASURING TESTING
Information Patent Application
PROBE POSITION INSPECTION APPARATUS, SEMICONDUCTOR DEVICE INSPECTIO...
- Publication number 20170102410
- Publication date Apr 13, 2017
- Mitsubishi Electric Corporation
- Norihiro TAKESAKO
- G01 - MEASURING TESTING
Information Patent Application
CONTACT-PROBE TYPE TEMPERATURE DETECTOR, SEMICONDUCTOR DEVICE EVALU...
- Publication number 20160377486
- Publication date Dec 29, 2016
- Mitsubishi Electric Corporation
- Kinya YAMASHITA
- G01 - MEASURING TESTING
Information Patent Application
MEASURING APPARATUS
- Publication number 20150362549
- Publication date Dec 17, 2015
- Mitsubishi Electric Corporation
- Takaya NOGUCHI
- G01 - MEASURING TESTING
Information Patent Application
MEASURING APPARATUS AND MEASURING METHOD
- Publication number 20150362527
- Publication date Dec 17, 2015
- Mitsubishi Electric Corporation
- Akira OKADA
- G01 - MEASURING TESTING
Information Patent Application
MEASUREMENT DEVICE
- Publication number 20150331011
- Publication date Nov 19, 2015
- Mitsubishi Electric Corporation
- Takaya NOGUCHI
- G01 - MEASURING TESTING
Information Patent Application
SEMICONDUCTOR EVALUATION APPARATUS
- Publication number 20150115989
- Publication date Apr 30, 2015
- Mitsubishi Electric Corporation
- Akira OKADA
- G01 - MEASURING TESTING
Information Patent Application
SEMICONDUCTOR TESTING JIG AND TRANSFER JIG FOR THE SAME
- Publication number 20150091599
- Publication date Apr 2, 2015
- Mitsubishi Electric Corporation
- Akira OKADA
- G01 - MEASURING TESTING
Information Patent Application
TEST APPARATUS AND TEST METHOD
- Publication number 20150044788
- Publication date Feb 12, 2015
- Mitsubishi Electric Corporation
- Akira OKADA
- G01 - MEASURING TESTING
Information Patent Application
FOREIGN MATTER REMOVAL DEVICE AND FOREIGN MATTER REMOVAL METHOD
- Publication number 20130192630
- Publication date Aug 1, 2013
- Mitsubishi Electric Corporation
- Akira OKADA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SEMICONDUCTOR CLEANING DEVICE AND SEMICONDUCTOR CLEANING METHOD
- Publication number 20130152965
- Publication date Jun 20, 2013
- Mitsubishi Electric Corporation
- Akira OKADA
- B08 - CLEANING
Information Patent Application
Polypropylene Resin Composition, Formed Product Composed of the Res...
- Publication number 20100286317
- Publication date Nov 11, 2010
- Kureha Corporation
- Hiroyuki Sato
- B29 - WORKING OF PLASTICS WORKING OF SUBSTANCES IN A PLASTIC STATE, IN GENERAL

Takaya Noguchi

Person

Patents Grantslast 30 patents

Semiconductor test apparatus and semiconductor test method

Semiconductor manufacturing apparatus and method of manufacturing s...

Electrical characteristic inspection device for semiconductor devic...

Semiconductor test apparatus, semiconductor device test method, and...

Evaluation apparatus of semiconductor device and method of evaluati...

Evaluation apparatus for semiconductor device and evaluation method...

Evaluation apparatus for semiconductor device and evaluation method...

Evaluation apparatus and evaluation method

Device and method for inspecting position of probe, and semiconduct...

Probe position inspection apparatus, semiconductor device inspectio...

Semiconductor device evaluation jig, semiconductor device evaluatio...

Evaluation apparatus and probe position inspection method

Measuring apparatus and measuring method utilizing insulating liquid

Measuring apparatus

Semiconductor evaluation apparatus

Foreign matter removal device and foreign matter removal method

Measurement device

Semiconductor testing jig and transfer jig for the same

Semiconductor cleaning device and semiconductor cleaning method

Test apparatus and test method

Patents Applicationslast 30 patents

METHOD OF MANUFACTURING SEMICONDUCTOR DEVICE AND SEMICONDUCTOR MANU...

SEMICONDUCTOR TEST APPARATUS AND SEMICONDUCTOR TEST METHOD

SEMICONDUCTOR DEVICE

SEMICONDUCTOR MANUFACTURING APPARATUS AND METHOD OF MANUFACTURING S...

SEMICONDUCTOR TEST APPARATUS AND SEMICONDUCTOR TEST METHOD

ELECTRICAL CHARACTERISTIC INSPECTION DEVICE FOR SEMICONDUCTOR DEVIC...

SEMICONDUCTOR TEST APPARATUS, SEMICONDUCTOR DEVICE TEST METHOD, AND...

EVALUATION APPARATUS OF SEMICONDUCTOR DEVICE AND METHOD OF EVALUATI...

EVALUATION APPARATUS AND EVALUATION METHOD

SEMICONDUCTOR DEVICE EVALUATION JIG, SEMICONDUCTOR DEVICE EVALUATIO...

DEVICE AND METHOD FOR INSPECTING POSITION OF PROBE, AND SEMICONDUCT...

EVALUATION APPARATUS AND PROBE POSITION INSPECTION METHOD

EVALUATION APPARATUS FOR SEMICONDUCTOR DEVICE AND EVALUATION METHOD...

PROBE POSITION INSPECTION APPARATUS, SEMICONDUCTOR DEVICE INSPECTIO...

CONTACT-PROBE TYPE TEMPERATURE DETECTOR, SEMICONDUCTOR DEVICE EVALU...

MEASURING APPARATUS

MEASURING APPARATUS AND MEASURING METHOD

MEASUREMENT DEVICE

SEMICONDUCTOR EVALUATION APPARATUS

SEMICONDUCTOR TESTING JIG AND TRANSFER JIG FOR THE SAME

TEST APPARATUS AND TEST METHOD

FOREIGN MATTER REMOVAL DEVICE AND FOREIGN MATTER REMOVAL METHOD

SEMICONDUCTOR CLEANING DEVICE AND SEMICONDUCTOR CLEANING METHOD

Polypropylene Resin Composition, Formed Product Composed of the Res...