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Takaya Satoh
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Tokyo, JP
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Patents Grants
last 30 patents
Information
Patent Grant
Mass spectrum processing apparatus and method
Patent number
12,014,914
Issue date
Jun 18, 2024
Jeol Ltd.
Takaya Satoh
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Mass spectrum processing apparatus and model generation method
Patent number
11,211,150
Issue date
Dec 28, 2021
Jeol Ltd.
Fuminori Uematsu
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Apparatus and method for processing mass spectrum
Patent number
10,629,420
Issue date
Apr 21, 2020
Jeol Ltd.
Takaya Satoh
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Time-of-flight mass spectrometer and method of controlling same
Patent number
9,536,727
Issue date
Jan 3, 2017
Jeol Ltd.
Takaya Satoh
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Imaging mass spectrometer and method of controlling same
Patent number
9,048,071
Issue date
Jun 2, 2015
Jeol Ltd.
Takaya Satoh
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Tandem time-of-flight mass spectrometer and method of mass spectrom...
Patent number
8,766,175
Issue date
Jul 1, 2014
Jeol Ltd.
Takaya Satoh
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Apparatus and method for time-of-flight mass spectrometry
Patent number
8,653,451
Issue date
Feb 18, 2014
Jeol Ltd.
Takaya Satoh
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Orthogonal acceleration time-of-flight mass spectrometer
Patent number
8,563,923
Issue date
Oct 22, 2013
Jeol Ltd.
Takaya Satoh
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Method and apparatus for tandem time-of-flight mass spectrometry
Patent number
8,330,100
Issue date
Dec 11, 2012
Jeol Ltd.
Takaya Satoh
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Instrument and method for tandem time-of-flight mass spectrometry
Patent number
7,755,036
Issue date
Jul 13, 2010
Jeol Ltd.
Takaya Satoh
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Method of mass analysis and mass spectrometer
Patent number
7,671,343
Issue date
Mar 2, 2010
Jeol Ltd.
Takaya Satoh
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Tandem mass spectrometry system
Patent number
7,531,793
Issue date
May 12, 2009
Jeol Ltd.
Takaya Satoh
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Time-of-flight mass spectrometer
Patent number
7,034,288
Issue date
Apr 25, 2006
Jeol Ltd.
Takaya Satoh
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
Polymer Analysis Apparatus and Method
Publication number
20240110897
Publication date
Apr 4, 2024
JEOL Ltd.
Takaya Satoh
G01 - MEASURING TESTING
Information
Patent Application
Mass Image Processing Apparatus and Method
Publication number
20230377116
Publication date
Nov 23, 2023
JEOL Ltd.
Masahiko Takei
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
Mass Spectrum Processing Device and Mass Spectrum Processing Method
Publication number
20220406585
Publication date
Dec 22, 2022
JEOL Ltd.
Takaya Satoh
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Mass Spectrum Processing Apparatus and Method
Publication number
20220122825
Publication date
Apr 21, 2022
JEOL Ltd.
Takaya Satoh
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Mass Spectrum Processing Apparatus and Model Generation Method
Publication number
20210065849
Publication date
Mar 4, 2021
JEOL Ltd.
Fuminori Uematsu
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Apparatus and Method for Processing Mass Spectrum
Publication number
20190228956
Publication date
Jul 25, 2019
JEOL Ltd.
Takaya Satoh
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Imaging Mass Spectrometer and Method of Controlling Same
Publication number
20140166874
Publication date
Jun 19, 2014
JEOL Ltd.
Takaya Satoh
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Time-of-Flight Mass Spectrometer and Method of Controlling Same
Publication number
20140077076
Publication date
Mar 20, 2014
JEOL Ltd.
Takaya Satoh
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Tandem Time-of-Flight Mass Spectrometer and Method of Mass Spectrom...
Publication number
20130306859
Publication date
Nov 21, 2013
JEOL Ltd.
Takaya Satoh
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Time-of-Flight Mass Spectrometer and Data Compression Method Therefor
Publication number
20130289892
Publication date
Oct 31, 2013
JEOL Ltd.
Takaya Satoh
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Apparatus and Method for Time-of-Flight Mass Spectrometry
Publication number
20120298855
Publication date
Nov 29, 2012
JEOL Ltd.
Takaya Satoh
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Tandem Time-of-Flight Mass Spectrometer
Publication number
20120085905
Publication date
Apr 12, 2012
JEOL Ltd.
Takaya Satoh
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Method and Apparatus for Tandem Time-of-Flight Mass Spectrometry
Publication number
20120068062
Publication date
Mar 22, 2012
JEOL Ltd.
Takaya Satoh
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Tandem Time-of-Flight Mass Spectrometer
Publication number
20110220786
Publication date
Sep 15, 2011
JEOL Ltd.
Takaya Satoh
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Orthogonal Acceleration Time-of-Flight Mass Spectrometer
Publication number
20090121130
Publication date
May 14, 2009
JEOL Ltd.
Takaya Satoh
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Instrument and Method for Tandem Time-of-Flight Mass Spectrometry
Publication number
20090026365
Publication date
Jan 29, 2009
JEOL Ltd.
Takaya Satoh
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Tandem mass spectrometry system
Publication number
20080067351
Publication date
Mar 20, 2008
JEOL Ltd.
Takaya Satoh
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Method of Mass Analysis and Mass Spectrometer
Publication number
20080061226
Publication date
Mar 13, 2008
JEOL Ltd.
Takaya Satoh
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Time-of-flight mass spectrometer
Publication number
20050023458
Publication date
Feb 3, 2005
JEOL Ltd.
Takaya Satoh
G01 - MEASURING TESTING