Takaya Yagyu

Person

  • Ishikawa-gun, JP

Patents Grantslast 30 patents

  • Information Patent Grant

    Scanning atom probe

    • Patent number 6,797,952
    • Issue date Sep 28, 2004
    • SII NanoTechnology Inc.
    • Takashi Kaito
    • G01 - MEASURING TESTING

Patents Applicationslast 30 patents

  • Information Patent Application

    Scanning atom probe

    • Publication number 20030066962
    • Publication date Apr 10, 2003
    • Takashi Kaito
    • B82 - NANO-TECHNOLOGY