Takayasu Iwatsuka

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Tokyo, JP

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Patents Grantslast 30 patents

Information Patent Grant
Charged particle beam device and method of measuring electrical noise
- Patent number 11,735,395
- Issue date Aug 22, 2023
- HITACHI HIGH-TECH CORPORATION
- Takayasu Iwatsuka
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
CHARGED PARTICLE BEAM APPARATUS
- Publication number 20240014002
- Publication date Jan 11, 2024
- HITACHI HIGH-TECH CORPORATION
- Takayasu IWATSUKA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CHARGED PARTICLE BEAM DEVICE AND METHOD OF MEASURING ELECTRICAL NOISE
- Publication number 20220037109
- Publication date Feb 3, 2022
- HITACHI HIGH-TECH CORPORATION
- Takayasu Iwatsuka
- H01 - BASIC ELECTRIC ELEMENTS