Takayasu Yamamoto

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Toyohashi-shi, JP

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Patents Grantslast 30 patents

Information Patent Grant
Eyeglass frame shape measurement apparatus
- Patent number 9,188,420
- Issue date Nov 17, 2015
- Nidek Co., Ltd.
- Takayasu Yamamoto
- G01 - MEASURING TESTING
Information Patent Grant
Eyeglass frame shape measuring apparatus
- Patent number 9,080,853
- Issue date Jul 14, 2015
- Nidek Co., Ltd.
- Takayasu Yamamoto
- B24 - GRINDING POLISHING
Information Patent Grant
Eyeglass frame shape measurement device
- Patent number 8,844,146
- Issue date Sep 30, 2014
- Nidek Co., Ltd.
- Yoshinori Matsuyama
- B24 - GRINDING POLISHING
Information Patent Grant
Eyeglass lens processing method
- Patent number 7,628,486
- Issue date Dec 8, 2009
- Nidek Co., Ltd.
- Motoshi Tanaka
- B24 - GRINDING POLISHING
Information Patent Grant
Eyeglass lens processing apparatus
- Patent number 7,437,809
- Issue date Oct 21, 2008
- Nidek Co., Ltd.
- Takayasu Yamamoto
- B24 - GRINDING POLISHING
Information Patent Grant
Defect inspection apparatus
- Patent number 7,333,650
- Issue date Feb 19, 2008
- Nidek Co., Ltd.
- Takayasu Yamamoto
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Inspecting device for semiconductor wafer
- Patent number 6,963,394
- Issue date Nov 8, 2005
- Nidek Co., Ltd.
- Takayasu Yamamoto
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
EYEGLASS FRAME SHAPE MEASURING APPARATUS
- Publication number 20140059871
- Publication date Mar 6, 2014
- NIDEK CO., LTD.
- Takayasu YAMAMOTO
- G02 - OPTICS
Information Patent Application
EYEGLASS FRAME SHAPE MEASUREMENT APPARATUS
- Publication number 20140020254
- Publication date Jan 23, 2014
- Takayasu YAMAMOTO
- G02 - OPTICS
Information Patent Application
EYEGLASS FRAME SHAPE MEASUREMENT DEVICE
- Publication number 20130067754
- Publication date Mar 21, 2013
- NIDEK CO., LTD.
- Yoshinori MATSUYAMA
- G02 - OPTICS
Information Patent Application
EYEGLASS LENS PROCESSING METHOD
- Publication number 20080088794
- Publication date Apr 17, 2008
- NIDEK CO., LTD.
- Motoshi TANAKA
- B24 - GRINDING POLISHING
Information Patent Application
Eyeglass lens processing apparatus
- Publication number 20060140731
- Publication date Jun 29, 2006
- NIDEK CO., LTD.
- Takayasu Yamamoto
- B28 - WORKING CEMENT, CLAY, OR STONE
Information Patent Application
Defect inspection apparatus
- Publication number 20050002560
- Publication date Jan 6, 2005
- NIDEK CO., LTD.
- Takayasu Yamamoto
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Inspecting device for semiconductor wafer
- Publication number 20040150814
- Publication date Aug 5, 2004
- NIDEK CO., LTD.
- Takayasu Yamamoto
- G01 - MEASURING TESTING