Takayuki Fukai

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Chiba-shi, JP

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Patents Grantslast 30 patents

Information Patent Grant
X-ray analysis apparatus and X-ray analysis method
- Patent number 7,587,025
- Issue date Sep 8, 2009
- SII NanoTechnology Inc.
- Takayuki Fukai
- G01 - MEASURING TESTING
Information Patent Grant
Energy dispersion type radiation detecting system and method of mea...
- Patent number 7,529,337
- Issue date May 5, 2009
- Sii Nano Technology Inc.
- Yoshiki Matoba
- G01 - MEASURING TESTING
Information Patent Grant
Fluorescent X-ray analysis apparatus
- Patent number 7,436,926
- Issue date Oct 14, 2008
- Sii Nano Technology Inc.
- Yoshiki Matoba
- G01 - MEASURING TESTING
Information Patent Grant
Fluorescent X-ray analysis apparatus
- Patent number 7,428,293
- Issue date Sep 23, 2008
- SII NanoTechnology Inc.
- Takayuki Fukai
- G01 - MEASURING TESTING
Information Patent Grant
Fluorescent x-ray analysis apparatus
- Patent number 7,424,093
- Issue date Sep 9, 2008
- SII NanoTechnology Inc.
- Takayuki Fukai
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
X-RAY ANALYSIS APPARATUS AND X-RAY ANALYSIS METHOD
- Publication number 20080212739
- Publication date Sep 4, 2008
- Takayuki Fukai
- G01 - MEASURING TESTING
Information Patent Application
Fluorescent X-ray analysis apparatus
- Publication number 20080013681
- Publication date Jan 17, 2008
- Takayuki Fukai
- G01 - MEASURING TESTING
Information Patent Application
Energy dispersion type radiation detecting system and method of mea...
- Publication number 20080008293
- Publication date Jan 10, 2008
- Yoshiki Matoba
- G01 - MEASURING TESTING
Information Patent Application
Fluorescent x-ray analysis apparatus
- Publication number 20070274441
- Publication date Nov 29, 2007
- Takayuki Fukai
- G01 - MEASURING TESTING
Information Patent Application
Fluorescent X-ray analysis apparatus
- Publication number 20070269004
- Publication date Nov 22, 2007
- SII NANO TECHNOLOGY INC.
- Yoshiki Matoba
- G01 - MEASURING TESTING