Takayuki Hirano

Person

Kobe, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Contact probe pin
- Patent number 9,625,492
- Issue date Apr 18, 2017
- Kobe Steel, Ltd.
- Takayuki Hirano
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Electrical contact member
- Patent number 9,459,282
- Issue date Oct 4, 2016
- Kobe Steel, Ltd.
- Norihiro Jiko
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Grant
Contact probe having carbon film on surface thereof
- Patent number 9,116,173
- Issue date Aug 25, 2015
- Kobe Steel, Ltd.
- Takayuki Hirano
- G01 - MEASURING TESTING
Information Patent Grant
Interconnection structure and display device including interconnect...
- Patent number 8,558,382
- Issue date Oct 15, 2013
- Kobe Steel, Ltd.
- Takeaki Maeda
- G02 - OPTICS
Information Patent Grant
Electric contact member
- Patent number 8,410,367
- Issue date Apr 2, 2013
- Kobe Steel, Ltd.
- Takayuki Hirano
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Temperature-measuring member, temperature-measuring device, and met...
- Patent number 8,162,538
- Issue date Apr 24, 2012
- Kabushiki Kaisha Kobe Seiko Sho.
- Masao Mizuno
- G01 - MEASURING TESTING
Information Patent Grant
Membrane structure element and method for manufacturing same
- Patent number 8,057,882
- Issue date Nov 15, 2011
- Kobe Steel, Ltd.
- Takayuki Hirano
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Grant
Contact probe pin
- Patent number 7,934,962
- Issue date May 3, 2011
- Kobe Steel, Ltd.
- Takayuki Hirano
- G01 - MEASURING TESTING
Information Patent Grant
Dielectric line and production method therefor
- Patent number 7,432,038
- Issue date Oct 7, 2008
- Kabushiki Kaisha Kobe Seiko Sho.
- Masakatsu Maruyama
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Feed antenna including dielectric waveguide
- Patent number 7,209,088
- Issue date Apr 24, 2007
- Kabushiki Kaisha Kobe Seiko Sho.
- Masakatsu Maruyama
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Electric-connection testing device
- Patent number 7,081,005
- Issue date Jul 25, 2006
- Kabushiki Kaisha Kobe Seiko Sho.
- Kenichi Inoue
- G01 - MEASURING TESTING
Information Patent Grant
Connection/inspection device for semiconductor elements
- Patent number 6,815,962
- Issue date Nov 9, 2004
- Kabushiki Kaisha Kobe Seiko Sho.
- Takayuki Hirano
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
ELECTRICAL CONTACT MEMBER AND INSPECTION CONNECTION DEVICE
- Publication number 20150301081
- Publication date Oct 22, 2015
- Kabushiki Kaisha Kobe Seiko Sho (Kobe Steel, Ltd.)
- Takayuki HIRANO
- G01 - MEASURING TESTING
Information Patent Application
ELECTRICAL CONTACT MEMBER
- Publication number 20140091823
- Publication date Apr 3, 2014
- Kabushiki Kaisha Kobe Seiko Sho (Kobe Steel, Ltd.)
- Norihiro Jiko
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Application
CONTACT PROBE PIN
- Publication number 20130222005
- Publication date Aug 29, 2013
- KOBELCO RESEARCH INSTITUTE, INC.
- Takayuki Hirano
- G01 - MEASURING TESTING
Information Patent Application
CONTACT PROBE
- Publication number 20130049784
- Publication date Feb 28, 2013
- KOBELCO RESEARCH INSTITUTE, INC.
- Takayuki Hirano
- G01 - MEASURING TESTING
Information Patent Application
REFLECTIVE ANODE ELECTRODE FOR ORGANIC EL DISPLAY
- Publication number 20120199866
- Publication date Aug 9, 2012
- Kabushiki Kaisha Kobe Seiko Sho (Kobe Steel, Ltd.)
- Yumi Iwanari
- C22 - METALLURGY FERROUS OR NON-FERROUS ALLOYS TREATMENT OF ALLOYS OR NON-FER...
Information Patent Application
INTERCONNECTION STRUCTURE AND DISPLAY DEVICE INCLUDING INTERCONNECT...
- Publication number 20120126227
- Publication date May 24, 2012
- Kabushiki Kaisha Kobe Seiko Sho(Kobe Steel, Ltd.)
- Takeaki Maeda
- G02 - OPTICS
Information Patent Application
ELECTRIC CONTACT MEMBER
- Publication number 20110214900
- Publication date Sep 8, 2011
- Kabushiki Kaisha Kobe Seiko Sho (Kobe Steel, Ltd.)
- Takayuki HIRANO
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CONTACT PROBE PIN
- Publication number 20110034093
- Publication date Feb 10, 2011
- Kabushiki Kaisha Kobe Seiko Sho (Kobe Steel, Ltd.)
- Takayuki HIRANO
- G01 - MEASURING TESTING
Information Patent Application
Membrane Structure Element and Method for Manufacturing Same
- Publication number 20090176064
- Publication date Jul 9, 2009
- Kabushiki Kaisha Kobe Seiko Sho (Kobe Steel, Ltd.)
- Takayuki Hirano
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Application
Dielectric line and production method therefor
- Publication number 20090017255
- Publication date Jan 15, 2009
- Kabushiki Kaisha Kobe Seiko Sho.
- Masakatsu Maruyama
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Temperature-measuring member, temperature-measuring device, and met...
- Publication number 20090016407
- Publication date Jan 15, 2009
- Kabushiki Kaisha Kobe Seiko Sho.
- Masao Mizuno
- G01 - MEASURING TESTING
Information Patent Application
Porous substrate with smooth surface and production method thereof
- Publication number 20070077409
- Publication date Apr 5, 2007
- Kabushiki Kaisha Kobe Seiko Sho.
- Takayuki Hirano
- B32 - LAYERED PRODUCTS
Information Patent Application
Dielectric line and production method therefor
- Publication number 20060102937
- Publication date May 18, 2006
- Kabushiki Kobe Seiko Sho
- Masakatsu Maruyama
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Feed antenna including dielectric waveguide
- Publication number 20060050003
- Publication date Mar 9, 2006
- Kabushiki Kaisha Kobe Seiko Sho.
- Masakatsu Maruyama
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Method for forming porous film and porous film formed by the method
- Publication number 20060051970
- Publication date Mar 9, 2006
- Kabushiki Kaisha Kobe Seiko Sho.
- Nobuyuki Kawakami
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Electric-connection testing device
- Publication number 20050140383
- Publication date Jun 30, 2005
- Kabushiki Kaisha Kobe Seiko Sho.
- Kenichi Inoue
- G01 - MEASURING TESTING
Information Patent Application
Method for producing porous material
- Publication number 20050119360
- Publication date Jun 2, 2005
- Kabushiki Kaisha Kobe Seiko Sho.
- Nobuyuki Kawakami
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Electric connection-inspection device
- Publication number 20030034782
- Publication date Feb 20, 2003
- Takayuki Hirano
- G01 - MEASURING TESTING

Takayuki Hirano

Person

Patents Grantslast 30 patents

Contact probe pin

Electrical contact member

Contact probe having carbon film on surface thereof

Interconnection structure and display device including interconnect...

Electric contact member

Temperature-measuring member, temperature-measuring device, and met...

Membrane structure element and method for manufacturing same

Contact probe pin

Dielectric line and production method therefor

Feed antenna including dielectric waveguide

Electric-connection testing device

Connection/inspection device for semiconductor elements

Patents Applicationslast 30 patents

ELECTRICAL CONTACT MEMBER AND INSPECTION CONNECTION DEVICE

ELECTRICAL CONTACT MEMBER

CONTACT PROBE PIN

CONTACT PROBE

REFLECTIVE ANODE ELECTRODE FOR ORGANIC EL DISPLAY

INTERCONNECTION STRUCTURE AND DISPLAY DEVICE INCLUDING INTERCONNECT...

ELECTRIC CONTACT MEMBER

CONTACT PROBE PIN

Membrane Structure Element and Method for Manufacturing Same

Dielectric line and production method therefor

Temperature-measuring member, temperature-measuring device, and met...

Porous substrate with smooth surface and production method thereof

Dielectric line and production method therefor

Feed antenna including dielectric waveguide

Method for forming porous film and porous film formed by the method

Electric-connection testing device

Method for producing porous material

Electric connection-inspection device