Membership
Tour
Register
Log in
Takayuki ISHIGURO
Follow
Person
Kamisato, JP
People
Overview
Industries
Organizations
People
Information
Impact
Patents Grants
last 30 patents
Information
Patent Grant
Method and apparatus for inspecting a surface of a substrate
Patent number
8,547,545
Issue date
Oct 1, 2013
Hitachi High-Technologies Corporation
Hideaki Sasazawa
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
MAGNETIC DISK INSPECTION DEVICE AND MAGNETIC DISK INSPECTION METHOD
Publication number
20160216216
Publication date
Jul 28, 2016
HITACHI HIGH-TECH FINE SYSTEMS CORPORATION
Shigeru SERIKAWA
G01 - MEASURING TESTING
Information
Patent Application
METHOD AND APPARATUS FOR INSPECTING A SURFACE OF A SUBSTRATE
Publication number
20120081701
Publication date
Apr 5, 2012
Hitachi High-Technologies Corporation
Hideaki SASAZAWA
G01 - MEASURING TESTING
Information
Patent Application
DISK SURFACE DEFECT INSPECTION METHOD AND APPARATUS
Publication number
20100246356
Publication date
Sep 30, 2010
Hitachi High-Technologies Corporation
Bin Abdulrashid FARIZ
G01 - MEASURING TESTING
Information
Patent Application
METHOD AND APPARATUS FOR INSPECTING A SURFACE OF A SPECIMEN
Publication number
20080239904
Publication date
Oct 2, 2008
Minoru YOSHIDA
G11 - INFORMATION STORAGE
Information
Patent Application
OPTICAL SYSTEM OF DETECTING PERIPHERAL SURFACE DEFECT OF GLASS DISK...
Publication number
20080088830
Publication date
Apr 17, 2008
Shigeru SERIKAWA
G01 - MEASURING TESTING
Information
Patent Application
DETECTION METHOD OF PERIPHERAL SURFACE DEFECT OF DISK AND DETECTION...
Publication number
20080080346
Publication date
Apr 3, 2008
Shigeru SERIKAWA
G11 - INFORMATION STORAGE
Information
Patent Application
TESTING METHOD FOR SURFACE DEFECTS ON DISC AND TESTING APPARATUS FO...
Publication number
20070222975
Publication date
Sep 27, 2007
SHIGERU SERIKAWA
G01 - MEASURING TESTING