Takayuki Katoh

Person

Tokyo, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Method of inspecting semiconductor device chip patterns on a wafer
- Patent number 7,876,119
- Issue date Jan 25, 2011
- Mitsubishi Denki Kabushiki Kaisha
- Takayuki Katoh
- G01 - MEASURING TESTING
Information Patent Grant
High frequency probe for examining electric characteristics of devices
- Patent number 6,617,864
- Issue date Sep 9, 2003
- Mitsubishi Denki Kabushiki Kaisha
- Akira Inoue
- G01 - MEASURING TESTING
Information Patent Grant
High-frequency integrated circuit and high-frequency circuit device...
- Patent number 6,555,907
- Issue date Apr 29, 2003
- Mitsubishi Denki Kabushiki Kaisha
- Takayuki Katoh
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Compact high-frequency circuit device
- Patent number 6,535,090
- Issue date Mar 18, 2003
- Mitsubishi Denki Kabushiki Kaisha
- Takayuki Matsuzuka
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Hermetically sealed millimeter-wave device
- Patent number 5,808,519
- Issue date Sep 15, 1998
- Mitsubishi Denki Kabushiki Kaisha
- Kei Gotoh
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor element evaluating apparatus
- Patent number 5,801,528
- Issue date Sep 1, 1998
- Mitsubishi Denki Kabushiki Kaisha
- Takayuki Katoh
- G01 - MEASURING TESTING
Information Patent Grant
Microwave semiconductor device and integrated circuit including mic...
- Patent number 5,528,074
- Issue date Jun 18, 1996
- Mitsubishi Denki Kabushiki Kaisha
- Kei Goto
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
High frequency IC package
- Patent number 5,418,329
- Issue date May 23, 1995
- Mitsubishi Denki Kabushiki Kaisha
- Takayuki Katoh
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
High frequency wafer probe including open end waveguide
- Patent number 5,408,188
- Issue date Apr 18, 1995
- Mitsubishi Denki Kabushiki Kaisha
- Takayuki Katoh
- G01 - MEASURING TESTING
Information Patent Grant
Optoelectronic integrated circuit
- Patent number 5,357,121
- Issue date Oct 18, 1994
- Mitsubishi Denki Kabushiki Kaisha
- Miyo Miyashita
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
High frequency signal transmission tape
- Patent number 5,349,317
- Issue date Sep 20, 1994
- Mitsubishi Denki Kabushiki Kaisha
- Yoshihiro Notani
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Microwave IC package
- Patent number 5,294,897
- Issue date Mar 15, 1994
- Mitsubishi Denki Kabushiki Kaisha
- Yoshihiro Notani
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Package for microwave IC
- Patent number 5,258,646
- Issue date Nov 2, 1993
- Mitsubishi Denki Kabushiki Kaisha
- Takayuki Katoh
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Package for microwave integrated circuit
- Patent number 5,235,208
- Issue date Aug 10, 1993
- Mitsubishi Denki Kabushiki Kaisha
- Takayuki Katoh
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Monolithic microwave IC oscillator
- Patent number 5,157,357
- Issue date Oct 20, 1992
- Mitsubishi Denki Kabushiki Kaisha
- Takayuki Katoh
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Semiconductor device operating in high frequency range
- Patent number 5,051,810
- Issue date Sep 24, 1991
- Mitsubishi Denki Kabushiki Kaisha
- Takayuki Katoh
- G01 - MEASURING TESTING
Information Patent Grant
Method of making a semiconductor device operating in high frequency...
- Patent number 5,010,019
- Issue date Apr 23, 1991
- Mitsubishi Denki Kabushiki Kaisha
- Takayuki Katoh
- G01 - MEASURING TESTING
Information Patent Grant
Semiconductor device operating in high frequency range
- Patent number 4,926,234
- Issue date May 15, 1990
- Mitsubishi Denki Kabushiki Kaisha
- Takayuki Katoh
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Method of inspecting semiconductor device
- Publication number 20070105248
- Publication date May 10, 2007
- Mitsubishi Denki Kabushiki Kaisha
- Takayuki Katoh
- G01 - MEASURING TESTING
Information Patent Application
High-frequency integrated circuit and high-frequency circuit device...
- Publication number 20020109223
- Publication date Aug 15, 2002
- Mitsubishi Denki Kabushiki Kaisha
- Takayuki Katoh
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Probe and method for examining electrical characteristics of devices
- Publication number 20010017549
- Publication date Aug 30, 2001
- Akira Inoue
- G01 - MEASURING TESTING

Takayuki Katoh

Person

Patents Grantslast 30 patents

Method of inspecting semiconductor device chip patterns on a wafer

High frequency probe for examining electric characteristics of devices

High-frequency integrated circuit and high-frequency circuit device...

Compact high-frequency circuit device

Hermetically sealed millimeter-wave device

Semiconductor element evaluating apparatus

Microwave semiconductor device and integrated circuit including mic...

High frequency IC package

High frequency wafer probe including open end waveguide

Optoelectronic integrated circuit

High frequency signal transmission tape

Microwave IC package

Package for microwave IC

Package for microwave integrated circuit

Monolithic microwave IC oscillator

Semiconductor device operating in high frequency range

Method of making a semiconductor device operating in high frequency...

Semiconductor device operating in high frequency range

Patents Applicationslast 30 patents

Method of inspecting semiconductor device

High-frequency integrated circuit and high-frequency circuit device...

Probe and method for examining electrical characteristics of devices