Takayuki Konya

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Tokyo, JP

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Patents Grantslast 30 patents

Information Patent Grant
Quantitative analysis apparatus, method and program and manufacturi...
- Patent number 12,174,131
- Issue date Dec 24, 2024
- Rigaku Corporation
- Takahiro Kuzumaki
- G01 - MEASURING TESTING
Information Patent Grant
Analysis apparatus, analysis method and analysis program
- Patent number 11,300,529
- Issue date Apr 12, 2022
- Rigaku Corporation
- Atsushi Ohbuchi
- G01 - MEASURING TESTING
Information Patent Grant
X-ray diffraction apparatus
- Patent number 8,903,044
- Issue date Dec 2, 2014
- Rigaku Corporation
- Sigematsu Asano
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
QUANTITATIVE ANALYSIS APPARATUS, METHOD AND PROGRAM AND MANUFACTURI...
- Publication number 20220390394
- Publication date Dec 8, 2022
- Rigaku Corporation
- Takahiro KUZUMAKI
- G01 - MEASURING TESTING
Information Patent Application
ANALYSIS APPARATUS, ANALYSIS METHOD AND ANALYSIS PROGRAM
- Publication number 20190041342
- Publication date Feb 7, 2019
- Rigaku Corporation
- Atsushi Ohbuchi
- G01 - MEASURING TESTING
Information Patent Application
X-RAY DIFFRACTION APPARATUS
- Publication number 20120195406
- Publication date Aug 2, 2012
- Rigaku Corporation
- Sigematsu Asano
- G01 - MEASURING TESTING