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Takayuki Noda
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Hitachinaka, JP
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Patents Grants
last 30 patents
Information
Patent Grant
Automatic analyzer
Patent number
11,085,940
Issue date
Aug 10, 2021
HITACHI HIGH-TECH CORPORATION
Takayuki Noda
G01 - MEASURING TESTING
Information
Patent Grant
Automatic analyzer
Patent number
11,073,525
Issue date
Jul 27, 2021
HITACHI HIGH-TECH CORPORATION
Yasuo Kaneko
G01 - MEASURING TESTING
Information
Patent Grant
Automatic analyzer
Patent number
10,942,194
Issue date
Mar 9, 2021
HITACHI HIGH-TECH CORPORATION
Takayuki Noda
G01 - MEASURING TESTING
Information
Patent Grant
Automatic centrifuge, pre-analysis system with automatic centrifuge...
Patent number
9,651,570
Issue date
May 16, 2017
Hitachi High-Technologies Corporation
Kenichi Yagi
G01 - MEASURING TESTING
Information
Patent Grant
Automatic analyzer
Patent number
8,758,684
Issue date
Jun 24, 2014
Hitachi High-Technologies Corporation
Kenichi Yagi
G01 - MEASURING TESTING
Information
Patent Grant
Processing device capable of implementing flexible access control
Patent number
7,540,019
Issue date
May 26, 2009
Hitachi High-Technologies Corporation
Takashi Noguchi
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Method of conveying sample rack and automated analyzer in which sam...
Patent number
6,599,749
Issue date
Jul 29, 2003
Hitachi, Ltd.
Ryuichiro Kodama
G01 - MEASURING TESTING
Information
Patent Grant
Method of conveying sample rack and automated analyzer in which sam...
Patent number
6,117,683
Issue date
Sep 12, 2000
Hitachi, Ltd.
Ryuichiro Kodama
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
ANALYSIS DEVICE AND AUTHENTICATION METHOD
Publication number
20230229745
Publication date
Jul 20, 2023
HITACHI HIGH-TECH CORPORATION
Sakiko NARIKAWA
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
AUTOMATIC ANALYZER
Publication number
20190079107
Publication date
Mar 14, 2019
Hitachi High-Technologies Corporation
Yasuo KANEKO
G01 - MEASURING TESTING
Information
Patent Application
AUTOMATIC ANALYZER
Publication number
20190011468
Publication date
Jan 10, 2019
Hitachi High-Technologies Corporation
Takayuki NODA
G01 - MEASURING TESTING
Information
Patent Application
AUTOMATIC ANALYZER
Publication number
20180224477
Publication date
Aug 9, 2018
Hitachi High-Technologies Corporation
Takayuki NODA
G01 - MEASURING TESTING
Information
Patent Application
AUTOMATIC CENTRIFUGE, PRE-ANALYSIS SYSTEM WITH AUTOMATIC CENTRIFUGE...
Publication number
20130281279
Publication date
Oct 24, 2013
Hitachi High-Technologies Corporation
Kenichi Yagi
B04 - CENTRIFUGAL APPARATUS OR MACHINES FOR CARRYING-OUT PHYSICAL OR CHEMICAL...
Information
Patent Application
AUTOMATIC ANALYZER
Publication number
20080310999
Publication date
Dec 18, 2008
Kenichi YAGI
G01 - MEASURING TESTING
Information
Patent Application
Processing device
Publication number
20050154919
Publication date
Jul 14, 2005
Takashi Noguchi
G06 - COMPUTING CALCULATING COUNTING