Takayuki Ohta

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Wakayama, JP

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Patents Grantslast 30 patents

Information Patent Grant
Interference measurement device and measurement method
- Patent number 9,041,937
- Issue date May 26, 2015
- National University Corporation Nagoya University
- Masaru Hori
- G01 - MEASURING TESTING
Information Patent Grant
Multi-micro hollow cathode light source and atomic absorption sepct...
- Patent number 8,638,034
- Issue date Jan 28, 2014
- National University Corporation Nagoya University
- Masaru Hori
- H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR

Patents Applicationslast 30 patents

Information Patent Application
MULTI-MICRO HOLLOW CATHODE LIGHT SOURCE AND ATOMIC ABSORPTION SEPCT...
- Publication number 20130027697
- Publication date Jan 31, 2013
- Masaru Hori
- G01 - MEASURING TESTING
Information Patent Application
INTERFERENCE MEASUREMENT DEVICE AND MEASUREMENT METHOD
- Publication number 20120300218
- Publication date Nov 29, 2012
- Masaru Hori
- G01 - MEASURING TESTING
Information Patent Application
Multi Micro-Hollow Cathode Light Source and Multi-Atomic Simulatane...
- Publication number 20090310134
- Publication date Dec 17, 2009
- Masaru Hori
- G01 - MEASURING TESTING