Membership
Tour
Register
Log in
Takayuki SHIMATOU
Follow
Person
Nagano, JP
People
Overview
Industries
Organizations
People
Information
Impact
Patents Grants
last 30 patents
Information
Patent Grant
Semiconductor package, semiconductor device and semiconductor devic...
Patent number
10,607,906
Issue date
Mar 31, 2020
Fuji Electric Co., Ltd.
Takayuki Shimatou
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Assessment method, and semiconductor device manufacturing method
Patent number
10,553,505
Issue date
Feb 4, 2020
Fuji Electric Co., Ltd.
Yasushi Niimura
G01 - MEASURING TESTING
Information
Patent Grant
Assessment method, and semiconductor device manufacturing method
Patent number
10,381,274
Issue date
Aug 13, 2019
Fuji Electric Co., Ltd.
Yasushi Niimura
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Semiconductor device
Patent number
9,620,595
Issue date
Apr 11, 2017
Fuji Electric Co., Ltd.
Takayuki Shimatou
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Semiconductor device
Patent number
8,872,245
Issue date
Oct 28, 2014
Fuji Electric Co., Ltd.
Takayuki Shimatou
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Method of manufacturing super-junction semiconductor device
Patent number
8,476,134
Issue date
Jul 2, 2013
Fuji Electric Co., Ltd.
Takayuki Shimatou
H01 - BASIC ELECTRIC ELEMENTS
Patents Applications
last 30 patents
Information
Patent Application
SEMICONDUCTOR DEVICE AND METHOD FOR MANUFACTURING SEMICONDUCTOR DEVICE
Publication number
20230154994
Publication date
May 18, 2023
Fuji Electric Co., Ltd.
Takayuki SHIMATOU
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
ASSESSMENT METHOD, AND SEMICONDUCTOR DEVICE MANUFACTURING METHOD
Publication number
20190363027
Publication date
Nov 28, 2019
Fuji Electric Co., Ltd.
Yasushi NIIMURA
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
SEMICONDUCTOR PACKAGE, SEMICONDUCTOR DEVICE AND SEMICONDUCTOR DEVIC...
Publication number
20180350705
Publication date
Dec 6, 2018
Fuji Electric Co., Ltd.
Takayuki SHIMATOU
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
ASSESSMENT METHOD, AND SEMICONDUCTOR DEVICE MANUFACTURING METHOD
Publication number
20170229356
Publication date
Aug 10, 2017
Fuji Electric Co., Ltd.
Yasushi NIIMURA
G01 - MEASURING TESTING
Information
Patent Application
SEMICONDUCTOR DEVICE
Publication number
20160126314
Publication date
May 5, 2016
Fuji Electric Co., Ltd.
Takayuki SHIMATOU
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
SEMICONDUCTOR DEVICE
Publication number
20140197476
Publication date
Jul 17, 2014
Fuji Electric Co., Ltd.
Takayuki SHIMATOU
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
METHOD OF MANUFACTURING SUPER-JUNCTION SEMICONDUCTOR DEVICE
Publication number
20110287598
Publication date
Nov 24, 2011
Fuji Electric Co., Ltd.
Takayuki SHIMATOU
H01 - BASIC ELECTRIC ELEMENTS